Metrology and Inspection Equipment

Metrology and inspection equipment are essential tools for precision measurement across various industries. Ensuring reliability and accuracy, these instruments support quality control and compliance in manufacturing processes.

  4. Holaday Microwave Survey Meter HI-1501

    Other Meters

    Holaday Microwave Survey Meter HI-1501

    Holaday Microwave Survey Meter, Model number HI-1501, for 2450MHz.  Manufactured by ETS-Lindgren. This Holaday HI-1501 survey meter comes in a portable, compact case.  The instrument is acceptable to the US Gov't Center for Devices and Radiological Health for compliance testing of microwaves and to all major microwave manufacturers for testing microwaves in use and after repair.  Comes with manual and carrying case, and has been tested. The detection probe and meter amplifier are calibrated as a unit and serves all three 2450MHz ranges:  2, 10, and 100 mW/cm2.
  6. DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Other Metrology Equipment

    DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Atomic Force Microscope AFMScanning Probe Microscope SPM

    Stage size: 300mm

    Accessories:

    • Stage Controller: NanoScope Model 5000C-1
    • Scanning Probe Microscope Controller: NanoScope IIIA
    • Vibration Isolation Table and Acoustic Enclosure
  8. KLA-Tencor ASET-F5x Thin Film Measurement System

    Other Film Thickness Testers

    KLA-Tencor ASET-F5x Thin Film Measurement System

    KLA-TENCOR ASET-F5x Thin Film Measurement System

    • Serial Number 0202802R
    • Manufactured in June, 2002
    • Inspection Modes Include:
      • Dual Beam Spectrometry
      • Spectroscopic Ellipsometry
      • Film Stress Analysis
      • SUMMIT™ Application Software Version 3.21.16
      • FTML Version 3.46.06
      • Model 300DFF1P Wafer Loading Platform
        • Dual Loadports for 300mm Wafers
        • Three Axis Wafer Handling Robot
        • GEM / SECS Communication
        • Inquire for Additional Details
  11. KLA-TENCOR HRP-240 High Resolution Profiler

    Profilometers

    KLA-TENCOR HRP-240 High Resolution Profiler

    KLA-TENCOR HRP-240 High Resolution Profiler

    • Cassette to Cassette Wafer Handling for up to 200mm Wafers
    • Previously Configured for SMIF Wafer Handling
    • Please Inquire for Additional Details
  12. SDI METRON / Semilab SDI-FAAST_230

    Other Metrology Equipment

    SDI METRON / Semilab SDI-FAAST_230

    Configuration: Mainframe

    Rack of Powersupply is defective – Powersupply is ok

    Function is ok – not in production but regular check

    Tool on cleanroom floor

    1 Palette of spares included:

    2x Motion Controller (Newport Modell MM3000)

    1x DSP Lock-IN Amplifier

    1x Roboter Controller (Pri ESC-212)

    1x Hot Chuck Temperatur Box (SDI)

    1x Controller Fe Activation Box (SDI)

    1x Roboter (Pri ATM-105-1-S)

    1x Voltmeter (PDM-40a)

    1x Voltmeter (PDM-60V)

    1x Function Generator (Wafetek model 29)

    1x Aligner (Brooks PRE-200)

    2x Power Supply (Bertan 2341-1)

    1x Box mit Anleitungen, div. Kleinteilen, Kabel

Popular Manufacturers

KLA-Tencor Plasmos Nanometrics Veeco Rudolph Technologies Digital Instruments Bio-Rad Insidix KLA Tencor Sagax

Common Applications

Semiconductor testing

Radiation safety assessment

Surface roughness measurement

Manufacturing quality control

Buying Guide

Metrology and Inspection Equipment Buying Guide

Choosing the right metrology and inspection equipment is crucial for maintaining precision in measurement tasks. Consider the following factors when evaluating your options.

Ensure the equipment is suitable for your specific application and industry needs. Used and surplus options can provide excellent value if thoroughly vetted.

  • Verify calibration status and calibration history for accurate results.
  • Check compatibility with existing systems and software.
  • Inspect the condition and any available service logs.
  • Confirm inclusion of manuals and necessary accessories for operation.

Frequently Asked Questions

What are C-V meters used for?
C-V meters are used to measure the capacitance-voltage characteristics of semiconductor materials.
How do microwave survey meters function?
Microwave survey meters detect microwave radiation levels and are used for safety assessments.
What is the role of a profilometer?
Profilometers are used to measure surface roughness and topography in a non-contact manner.
Why choose surplus metrology equipment?
Surplus metrology equipment offers cost-effective solutions while maintaining precision and reliability.