Metrology and Inspection Equipment

Metrology and inspection equipment are essential tools for precision measurement across various industries. Ensuring reliability and accuracy, these instruments support quality control and compliance in manufacturing processes.

  4. Holaday Microwave Survey Meter HI-1501

    Other Meters

    Holaday Microwave Survey Meter HI-1501

    Holaday Microwave Survey Meter, Model number HI-1501, for 2450MHz.  Manufactured by ETS-Lindgren. This Holaday HI-1501 survey meter comes in a portable, compact case.  The instrument is acceptable to the US Gov't Center for Devices and Radiological Health for compliance testing of microwaves and to all major microwave manufacturers for testing microwaves in use and after repair.  Comes with manual and carrying case, and has been tested. The detection probe and meter amplifier are calibrated as a unit and serves all three 2450MHz ranges:  2, 10, and 100 mW/cm2.
  6. DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Other Metrology Equipment

    DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Atomic Force Microscope AFMScanning Probe Microscope SPM

    Stage size: 300mm

    Accessories:

    • Stage Controller: NanoScope Model 5000C-1
    • Scanning Probe Microscope Controller: NanoScope IIIA
    • Vibration Isolation Table and Acoustic Enclosure

    Make: Digital Instruments

    Model: Nanoscope IIIA

    1 unit @ Best Price

    Scotia, NY US

    Item 106265

  8. AOI Orbotech Ultra Discovery VM

    Other Metrology Equipment

    AOI Orbotech Ultra Discovery VM

    Simple, Intelligent, Powerful

    Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production.

    Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time.

    Benefits

    • High throughput and superior detection with minimal number of false calls
    • Especially designed for inspection of the finest lines down to 10μm
    • Quick set-up even for the most complicated jobs for higher productivity
    • Automation ready
    • Very high uptime

    • SIP TechnologyTM

      Push-to-Scan®:

      • A ‘no set-up’ process
      • Top AOI results with minimal effort or training
      • The easiest, user-friendly interface (GUI)
      • Full ‘Step and Repeat’ functions

        Visual Intelligence:

        Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want.

        Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects.

        Visual Intelligence:

        • Full panel understanding, context-based detection engine
        • Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
  10. KLA-Tencor ASET-F5x Thin Film Measurement System

    Other Film Thickness Testers

    KLA-Tencor ASET-F5x Thin Film Measurement System

    KLA-TENCOR ASET-F5x Thin Film Measurement System

    • Serial Number 0202802R
    • Manufactured in June, 2002
    • Inspection Modes Include:
      • Dual Beam Spectrometry
      • Spectroscopic Ellipsometry
      • Film Stress Analysis
      • SUMMIT™ Application Software Version 3.21.16
      • FTML Version 3.46.06
      • Model 300DFF1P Wafer Loading Platform
        • Dual Loadports for 300mm Wafers
        • Three Axis Wafer Handling Robot
        • GEM / SECS Communication
        • Inquire for Additional Details

Common Applications

Semiconductor testing

Radiation safety assessment

Surface roughness measurement

Manufacturing quality control

Buying Guide

Metrology and Inspection Equipment Buying Guide

Choosing the right metrology and inspection equipment is crucial for maintaining precision in measurement tasks. Consider the following factors when evaluating your options.

Ensure the equipment is suitable for your specific application and industry needs. Used and surplus options can provide excellent value if thoroughly vetted.

  • Verify calibration status and calibration history for accurate results.
  • Check compatibility with existing systems and software.
  • Inspect the condition and any available service logs.
  • Confirm inclusion of manuals and necessary accessories for operation.

Frequently Asked Questions

What are C-V meters used for?
C-V meters are used to measure the capacitance-voltage characteristics of semiconductor materials.
How do microwave survey meters function?
Microwave survey meters detect microwave radiation levels and are used for safety assessments.
What is the role of a profilometer?
Profilometers are used to measure surface roughness and topography in a non-contact manner.
Why choose surplus metrology equipment?
Surplus metrology equipment offers cost-effective solutions while maintaining precision and reliability.
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