Wafer Inspection Tools
Wafer inspection tools are essential for detecting defects and ensuring quality in semiconductor manufacturing. These tools support high precision and reliability in production processes.
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Overlay Registration Tool - Has Been Upgraded to a Q6 CD Measurement, Single and Two-Axis Overlay Registration -
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BioRad Q7/Q8 Overlay Metrology Tool
Overlay Metrology Tool for up to 200mm Wafers -
Automatic Wafer Inspection Tools
KLA-Tencor 2138XP Brightfield Inspection Tool
KLA-Tencor 2138XP Brightfield Defect Inspection Tool
- 0.25µ, 0.39µ, 0.62µ Spot Sizes
- For 150mm & 200mm Wafers
- Model 2552UI User Interface
- Denkenseiki Noise Filter
- Please Inquire for Additional Details
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KLA-TENCOR Archer 200 AIM Overlay Metrology Tool
KLA-TENCOR Archer 200 AIM Overlay Metrology Tool
- ETAL Stage
- Yaskawa Robot with NXC100 Controller
- IDE Maxon 1000 Floatation Controller
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Common Applications
Defect detection
Quality assurance in semiconductor manufacturing
Overlay measurement
Wafer surface inspection
Frequently Asked Questions
What are wafer inspection tools?
Wafer inspection tools are used to detect defects and ensure quality in semiconductor manufacturing.
How do automatic inspection stations work?
These stations use advanced technology to automatically examine wafers for defects.
Are surplus wafer inspection tools reliable?
Surplus tools can be reliable if they are verified for condition and functionality.
What brands offer wafer inspection tools?
Brands like KLA-Tencor, Nikon, and BioRad offer wafer inspection tools.
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