Ellipsometers
Ellipsometers are specialized instruments used to measure the thickness and optical properties of thin films. They ensure precise and reliable results in various materials analysis applications.
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Plasmos SD-2004 Multi-Wavelength Ellipsometer
Plasmos SD-2004 Multi-Wavelength Ellipsometer -
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Nanometrics 8300XSE Film Thickness Analyzer
Nanometrics 8300XSE Film Thickness Analyzer
- J.A. Woollam M-44 Spectroscopic Ellipsometer
- J.A. Woollam EC-270 Ellipsometer Controller
- J.A. Woollam LPS-420 Xenon Light Source
- Manual Loading of up to 300mm Wafers
- Yaskawa ERCR-NS01-B004 Motion Controller
- Please Inquire for Additional Details
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Plasmos SD2000 Automatic Ellipsometer
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Common Applications
thin film analysis
optical property measurement
materials research
quality control in manufacturing
Frequently Asked Questions
What is an ellipsometer used for?
Ellipsometers are used to measure the thickness and optical properties of thin films.
Can ellipsometers analyze multiple wavelengths?
Yes, some models like the Plasmos SD-2004 are designed for multi-wavelength analysis.
What brands of ellipsometers are available?
Brands such as GAERTNER, Sagax, RUDOLPH RESEARCH, Plasmos, and J.A. Woollam are available.
Is refurbished ellipsometer equipment reliable?
Yes, refurbished ellipsometers are often reliable if sourced from reputable marketplaces and verified for functionality.
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