Unpatterned Wafer Inspection

Unpatterned wafer inspection tools evaluate the surface quality of wafers before pattern application. They support the production of high-quality semiconductor devices by detecting defects early.

  1. Tencor Surfscan 4500

    Unpatterned Wafer Inspection

    Tencor Surfscan 4500

    TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool

    • Cassette to Cassette Handling of 3” – 6” Wafers
    • New HeNe 2mW Laser, 632.8 nm Wavelength
    • New HeNe Laser Power Supply
    • 2 µ Particle Size Sensitivity
    • Automatic Calibration
    • Flatscreen Monitor
    • System Calibrated & Demonstrated
    • Calibration Standard Wafer Included
  2. Takano WM-7S Unpatterned Wafer Surface Inspection Tool

    Unpatterned Wafer Inspection

    Takano WM-7S Unpatterned Wafer Surface Inspection Tool

    Takano WM-7S Unpatterned Wafer Surface Inspection Tool

    • 405 nm Laser Source
    • Particle Detection Down to 79 nm 
    • Configured for 200mm Wafers
    • Manufactured in 2023
    • Unused Since Installation/Qualification  
  3. KLA-TENCOR Puma 9130 Darkfield Inspection Tool

    Unpatterned Wafer Inspection

    KLA-TENCOR Puma 9130 Darkfield Inspection Tool

    KLA-TENCOR Puma 9130 Darkfield Inspection Tool

    • Parts Tool
    • Please Inquire for Additional Details
  4. KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool

    Unpatterned Wafer Inspection

    KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool

    KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool

    • For 200mm or 300mm Wafers
    • 2ea Cameras
    • Please Inquire for Additional Details

Common Applications

Semiconductor Fabrication

Quality Control

Surface Defect Analysis

Buying Guide

Unpatterned Wafer Inspection Buying Guide

Purchasing unpatterned wafer inspection tools requires attention to specific features and conditions to ensure optimal performance in your semiconductor production line.

Consider the following when reviewing surplus options:

  • Verify configuration and compatibility with existing systems, especially for cassette handling.
  • Examine the condition and calibration history to assess current operational reliability.
  • Ensure the presence of necessary utilities and interfaces, such as laser sources and power supplies.
  • Request documentation and manuals to confirm all functional and technical details.

Frequently Asked Questions

What is the purpose of unpatterned wafer inspection tools?
They detect surface defects on wafers before patterns are applied, ensuring quality in semiconductor manufacturing.
What types of inspection methods are used?
Surface flatness analysis and darkfield inspection are common methods for unpatterned wafer inspection.
Which brands are known for unpatterned wafer inspection?
KLA-Tencor and Takano are brands featured in this marketplace for these tools.
Why choose surplus unpatterned wafer inspection equipment?
Surplus equipment can offer significant cost savings while still delivering reliable performance.