Wafer Inspection Microscopes
Wafer inspection microscopes are specialized tools designed for detecting defects and analyzing wafers in semiconductor production. They enhance accuracy and reliability in quality control processes.
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LEICA/REICHERT MICROSCOPE, MANUAL WAFER INSPECTION
Manual Wafer Inspection MicroscopeMicroVision MVT 1080 Wafer Loader
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LEICA/REICHERT WAFER INSPECTION MICROSCOPE
Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system
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OLYMPUS SEMICONDUCTOR INSPECTION MICROSCOPE
Semiconductor Inspection MicroscopeReflected and Transmitted Light
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LEICA AUTOMATED WAFER INSPECTION MICROSCOPE
Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system
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Nikon Optiphot-150S Wafer Inspection Microscope
Nikon Optiphot-150S Wafer Inspection Microscope
- 2.5X, 5X, 10X, 20X & 50X CF Plan Bright/Darkfield Objective Lenses
- Binocular Head with CFWN 10X/20 WF Eyepieces
- Wafer Stage for Use with Nikon NWL-641 Wafer Loader
- 12V/50W Lamphouse with Internal Illumination Transformer
- Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage
- Macro Inspection Capability
- Also Available with Bright/Darkfield Objective Lenses
- Also Available with Ergo Trinocular Head and Color Camera
- Also Available without NWL-641 Wafer Loader
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Nikon Optiphot 200
NIKON Optiphot 200 Wafer Inspection Stand, Including
- Focus Mechanism
- Interference Contrast Polarizer/Analyzer
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LEICA/REICHERT WAFER INSPECTION MICROSCOPE
Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system
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Nikon/Semprex Measuring Microscope
NIKON/SEMPREX Wafer Measuring Microscope
- 4 Position Turret
- NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses
- NIKON Binocular Viewing Head with 10X Widefield Eyepieces
- NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing
- Brightfield & Darkfield Channels
- Dual Iris Apertures
- NIKON Model UN Illumination Transformer
- SEMPREX Microscope Stand
- Specimen Stage 6” X 6.75”
- 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement
- 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001”
- Mitutoyo 534-223-1 Digital Micrometer for Height Measurement
- 0-1” in Z Axis; Resolution to 0.0001”
- Specimen Stage 6” X 6.75”
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Olympus MX80AF-F Wafer Inspection Microscope
Olympus MX80AF-F Wafer Inspection Microscope
- Autofocus Capability
- Ludl Motorized Stage for up to 300mm Wafers
- Bright/Darkfield Optics:
- Motorized Turret with 6ea Objective Lenses:
- 5X, 10X, 20X, 50X & 100X UMPlanFl BD P
- 150X LMPlan Apo BD
- Interference Contrast Optical System
- Trinocular Viewing Head with Color CCD Camera & Monitor
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Olympus MX50 Wafer Inspection Microscope
OLYMPUS MX50A-F Reflected Light Microscope
- Five Position Motorized Turret with the Following Objective Lenses:
- OLYMPUS MPlanFl N 5X/0.15 BD
- OLYMPUS UMPlanFl 10X/0.30 BD
- OLYMPUS LMPlanFl 20X/0.40 BD
- OLYMPUS LMPlanFl 50X /0.50 BD
- OLYMPUS Trinocular Head with 2ea OLYMPUS WH10X Eyepieces
- OLYMPUS DBX Extension Tube with DIAGNOSTIC INST. 1.0X C Mount Adapter
- PIXELINK PL-B777U Solid State Camera
- Specimen Stage with 150mm X 150mm XY Travel
- OLYMPUS MX-LSH Lamp House with 12V 100W Halogen Lamp
- 100/115VAC 50/60Hz Input Voltage
- Five Position Motorized Turret with the Following Objective Lenses:
Common Applications
Semiconductor production
Defect analysis
Quality control
Wafer evaluation
Frequently Asked Questions
What types of defects can wafer inspection microscopes detect?
What is a common feature of surplus wafer inspection microscopes?
Are these microscopes suitable for all wafer sizes?
What brands of wafer inspection microscopes are available?
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