Wafer Inspection Microscopes

Wafer inspection microscopes are specialized tools designed for detecting defects and analyzing wafers in semiconductor production. They enhance accuracy and reliability in quality control processes.

  1. LEICA/REICHERT WAFER INSPECTION MICROSCOPE

    Wafer Inspection Microscopes

    LEICA/REICHERT WAFER INSPECTION MICROSCOPE

    Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system

  2. LEICA AUTOMATED WAFER INSPECTION MICROSCOPE

    Wafer Inspection Microscopes

    LEICA AUTOMATED WAFER INSPECTION MICROSCOPE

    Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system

  3. Nikon Optiphot-150S Wafer Inspection Microscope

    Wafer Inspection Microscopes

    Nikon Optiphot-150S Wafer Inspection Microscope

    Nikon Optiphot-150S Wafer Inspection Microscope

    • 2.5X, 5X, 10X, 20X & 50X CF Plan Bright/Darkfield Objective Lenses
    • Binocular Head with CFWN 10X/20 WF Eyepieces
    • Wafer Stage for Use with Nikon NWL-641 Wafer Loader
    • 12V/50W Lamphouse with Internal Illumination Transformer
    • Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage
    • Macro Inspection Capability
    • Also Available with Bright/Darkfield Objective Lenses 
    • Also Available with Ergo Trinocular Head and Color Camera
    • Also Available without NWL-641 Wafer Loader
  4. LEICA/REICHERT WAFER INSPECTION MICROSCOPE

    Wafer Inspection Microscopes

    LEICA/REICHERT WAFER INSPECTION MICROSCOPE

    Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system

  5. Nikon/Semprex Measuring Microscope

    Wafer Inspection Microscopes

    Nikon/Semprex Measuring Microscope

     NIKON/SEMPREX Wafer Measuring Microscope

    • 4 Position Turret
    • NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses
    • NIKON Binocular Viewing Head with 10X Widefield Eyepieces
    • NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing
      • Brightfield & Darkfield Channels
      • Dual Iris Apertures
      • NIKON Model UN Illumination Transformer
      • SEMPREX Microscope Stand
        • Specimen Stage 6” X 6.75”
          • 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement
          • 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001”
          • Mitutoyo 534-223-1 Digital Micrometer for Height Measurement
          • 0-1” in Z Axis; Resolution to 0.0001”
  6. Olympus MX80AF-F Wafer Inspection Microscope

    Wafer Inspection Microscopes

    Olympus MX80AF-F Wafer Inspection Microscope

    Olympus MX80AF-F Wafer Inspection Microscope

    • Autofocus Capability
    • Ludl Motorized Stage for up to 300mm Wafers
    • Bright/Darkfield Optics:
    • Motorized Turret with 6ea Objective Lenses:
      • 5X, 10X, 20X, 50X & 100X UMPlanFl BD P 
      • 150X LMPlan Apo BD  
      • Interference Contrast Optical System
      • Trinocular Viewing Head with Color CCD Camera & Monitor
  7. Olympus MX50 Wafer Inspection Microscope

    Wafer Inspection Microscopes

    Olympus MX50 Wafer Inspection Microscope

    OLYMPUS MX50A-F  Reflected Light Microscope

    • Five Position Motorized Turret with the Following Objective Lenses:
      • OLYMPUS MPlanFl N 5X/0.15 BD
      • OLYMPUS UMPlanFl 10X/0.30 BD
      • OLYMPUS LMPlanFl 20X/0.40 BD
      • OLYMPUS LMPlanFl 50X /0.50 BD
      • OLYMPUS Trinocular Head with 2ea OLYMPUS WH10X Eyepieces
        • OLYMPUS DBX Extension Tube with DIAGNOSTIC INST. 1.0X C Mount Adapter
        • PIXELINK PL-B777U Solid State Camera
        • Specimen Stage with 150mm X 150mm XY Travel
        • OLYMPUS MX-LSH Lamp House with 12V 100W Halogen Lamp
        • 100/115VAC 50/60Hz Input Voltage

Common Applications

Semiconductor production

Defect analysis

Quality control

Wafer evaluation

Buying Guide

Wafer Inspection Microscopes Buying Guide

Wafer inspection microscopes are crucial in the semiconductor industry for identifying defects during production. Buyers must consider several factors when selecting these specialized tools.

It's essential to verify the equipment's compatibility with the desired wafer size, as well as the condition of optical components.

  • Check the microscope's compatibility with standard wafer sizes, such as 200mm or 300mm.
  • Verify the condition and functionality of the optical system.
  • Consider the availability of manuals or documentation for surplus items.
  • Inspect for any missing or non-functioning parts that might affect performance.

Frequently Asked Questions

What types of defects can wafer inspection microscopes detect?
These microscopes can detect surface defects, pattern defects, and particle contamination on wafers.
What is a common feature of surplus wafer inspection microscopes?
Surplus models often include advanced optical systems for high-precision inspection.
Are these microscopes suitable for all wafer sizes?
They are typically compatible with standard sizes, such as 200mm and 300mm wafers.
What brands of wafer inspection microscopes are available?
Brands like KLA Tencor and HSEB are commonly available in the surplus market.
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