FT-IR Spectrometers

FT-IR spectrometers are precision instruments used to obtain high-resolution spectral data. These tools enhance the accuracy and reliability of analytical results in various applications.

  1. NICOLET (THERMO) FT-IR SPECTROMETER

    FT-IR Spectrometers

    NICOLET (THERMO) FT-IR SPECTROMETER

    FT-IR with Spectra-Tech Continuum Scope and TGA Interface Nicolet NEXUS 470

    Nicolet acquired by Thermo Scientific

  2. ADE Episcan 1000

    FT-IR Spectrometers

    ADE Episcan 1000

    ADE Episcan 1000 Film Thickness Measurement & Mapping Tool

    • Measurement of Epi Films <25µ
    • ON-LINE TECHNOLOGIES 2110 Spectrometer Head
    • IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler
    • ADE ACS Controller
    • Windows NT Operating System
    • Price.............................................................................$75,000.00
    • As-Is Price....................................................................$40,000.00
  3. Bio-Rad QS-500 FT-IR Spectrometer

    FT-IR Spectrometers

    Bio-Rad QS-500 FT-IR Spectrometer

    Bio-Rad QS-500 FT-IR Spectrometer

    • Transmissive & Reflective Film Measurement 
      • Si Epi Thickness, C & O in Si, BPSG Analysis
      • KBr Optical Components
      • Bio-Rad SPC 3200 Data Station
      • Upgradable to Computer Running Windows XP 
      • Bio-Rad 013-4100 Spectrometer Controller
      • Bio-Rad Stage Controller
      • Bio-Rad Robot Interface
      • Genmark Robot & Controller
  4. Bio-Rad QS-1200 FT-IR Spectrometer

    FT-IR Spectrometers

    Bio-Rad QS-1200 FT-IR Spectrometer

    BIORAD QS-1200 Automated FT-IR Spectrometer

    • Non-Destructive Measurement of Epitaxial Silicon Films
    • PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage
      • Manual Loading for up to 300mm Wafers
      • 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping
      • FTS-175 Optical Bench
        • Dynamically Tuned Beam Splitter
        • NKBr Beam Splitter
        • Dual Frequency IR Source
        • Upgraded HeNe Laser
        • System Control PC with Windows XP, 320G HD & 1G RAM
          • Win-IR Pro (Rev. 2.51) Application Software
          • QS-500 Epi (Rev. 1.31) Application Software
          • Microsoft Access Database Application
          • System Software, Applications Software & Site Preparation Manuals Included
          • Refurbished & Fully Functional
  6. Accent Optical Technologies QS-2200A FT-IR Spectrometer

    FT-IR Spectrometers

    Accent Optical Technologies QS-2200A FT-IR Spectrometer

    Accent  Optical Technologies QS-2200A FT-IR Spectrometer

    • KBR Optical Components
    • Reflective Measurement of Epitaxial Silicon Thickness
    • Automatic Wafer Handling
      • Genmark Robot with Integrated Flatfinder & Controller
      • Dual Cassette Platforms for up to 200mm Wafers
      • ACCENT Robot Interface
      • ACCENT 013-4738-2 Stage Controller
      • ACCENT 013-4758-2 AC Power Box
      • Control PC Running Windows XP OS
      • ACCENT GUI Application Software
      • SECS/GEM Interface Software

Common Applications

Epitaxial silicon film measurement

Transmissive film analysis

Reflective film measurement

Infrared spectroscopic analysis

Chemical substance identification

Buying Guide

FT-IR Spectrometers Buying Guide

When selecting a surplus FT-IR spectrometer, it is crucial to assess specific features pertinent to your analytical needs. Ensure the model you consider is compatible with your existing laboratory setup.

Look for instruments that offer comprehensive spectral analysis capabilities, including both transmissive and reflective options, to maximize versatility.

  • Verify the spectrometer's calibration status to ensure accurate readings.
  • Check for included accessories and documentation to support seamless integration into your workflow.
  • Evaluate the condition of the equipment to avoid potential operational issues.
  • Consider units with upgradable features for future-proofing your analytical needs.

Frequently Asked Questions

What is an FT-IR spectrometer used for?
FT-IR spectrometers are used for obtaining high-resolution infrared spectra, which help in identifying chemical substances and assessing material properties.
How does film thickness measurement work?
Film thickness measurement in FT-IR spectrometers is achieved through spectral analysis that measures light absorption at different thickness levels.
Can FT-IR spectrometers handle reflective measurements?
Yes, certain FT-IR spectrometers are designed to perform both transmissive and reflective measurements for versatile analysis.
What should I consider when buying a surplus FT-IR spectrometer?
Check the condition, included accessories, calibration status, and compatibility with your specific analytical needs.
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