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Critical Dimension Scanning Electron Microscopes


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Item IDPhotoItem DescriptionSize RangeResolution ÅCD Measure RangeCass to CassTilt Stage#PriceNotes Location
MakeModelSet SizeMinMax
(Å)(µm)(µm)$
180474 Applied Materials NanoSEM 3D300 mm 1 F* East Fishkill, NY
180514 Applied Materials NanoSEM 3D300 mm 1 F* East Fishkill, NY
203103 Applied Materials NanoSEM 3D 1 East Fishkill, New York
203104 Applied Materials NanoSEM 3D 1 East Fishkill, New York
203105 Applied Materials NanoSEM 3D 1 East Fishkill, New York
203106 Applied Materials NanoSEM 3D 1 F* East Fishkill, New York
203107 Applied Materials NanoSEM 3D 1 East Fishkill, New York
206308 Applied Materials Verity 4i 1 Malta, New York
206309 Applied Materials Verity 4i 1 Malta, New York
35762 Hitachi S-7000150 mm150.000.10200.00YESYES 1 F* Plano, TX
178287 Hitachi S-7800 1 F* Singapore
195362 Hitachi S-9380 1 F* Singapore
205450 Hitachi S-9380 1 F* Seoul
205386 Hitachi S-9380 II 1 Taichung, Taichung City
201534 Hitachi S-9380 II 1 Taichung, Taichung City
205383 Hitachi S-9380 II 1 Singapore
205384 Hitachi S-9380II 1 Singapore
205385 Hitachi S-9380II 1 Taichung, Taichung City
205382 Hitachi S-9380II 1 F* Taichung, Taichung City
204498 Hitachi S-9380II 1 Taichung, Taichung City
197918 Hitachi S-9380II 1 Taichung, Taichung City
178288 Hitachi S-9380II 1 Taichung, Taichung City
205387 Hitachi S-9380II 1 Taichung, Taichung City
205388 Hitachi S-9380II 1 Taichung, Taichung City
204499 Hitachi S9380II 1 Taichung, Taichung City
77955 JEOL JWS-7505ZH80.00YES 1 F* Plano, TX

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Critical Dimension Scanning Electron Microscopes:
Applied Materials, Inc., Hitachi, JEOL