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Metrology Equipment


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 Parts and Accessories - Other  in Parts and Accessories, Microscope  (22)

 Patterned Wafer Inspection  in Surface Inspection  (2)

 Polishing & Grinding Sample Prep Equipment  in Sample Preparation  (1)

 Profilometers  in Film Thickness Testers  (4)

 Sample Coaters  in Sample Preparation  (2)

 Optical CD Measurement  in Critical Dimension Measurement Equipment  (1)

 Other Items  in Microscopes  (2)

 Overlay Registration  in Critical Dimension Measurement Equipment  (3)

 Objective Lenses  in Parts and Accessories, Microscope  (1)

 Stereo Microscopes  in Optical Microscopes  (46)

 Stress Measurement Equipment  in Metrology Equipment  (2)

 Unpatterned Wafer Inspection  in Surface Inspection  (11)

 Upright Microscopes  in Optical Microscopes  (26)

 UV-Visible Spectrophotometers  in Spectrophotometers  (1)

 Wafer Inspection Microscopes  in Optical Microscopes  (33)

 Xray Fluorescence Spectrometers  in Spectrometers  (2)

 Stands  in Parts and Accessories, Microscope  (17)

 FT-IR Spectrometers  in Spectrometers  (4)

 Sample Preparation - Other  in Sample Preparation  (3)

 Fiber Optic Light Sources  in Fiber Optic Illuminators  (7)

 Scanning Electron Microscopes  in Electron Microscopy  (14)

 Film Thickness Testers - Other  in Film Thickness Testers  (4)

 Microscopes - Other  in Optical Microscopes  (8)

 4 & 6 Point Probes  in Resistivity Testers  (1)

 Critical Dimension Scanning Electron Microscopes  in Critical Dimension Measurement Equipment  (2)

 Inverted Microscopes  in Optical Microscopes  (1)

 Automatic Wafer Inspection Tools  in Microscope Inspection Tools  (4)

 Cut-Off Saws  in Slicing Saws  (4)

 Measuring Microscopes  in Optical Microscopes  (6)

 CV Plotters  in Metrology Equipment  (2)

 Metrology Equipment - Other  in Metrology Equipment  (14)

 Ellipsometers  in Film Thickness Testers  (11)

Items from the following manufacturers are offered under Metrology Equipment:
ADE, AMAT, American Optical, Anatech Ltd, Applied Materials, Inc., ATM GmbH, Bausch & Lomb, Inc, Bausch and Lomb, Bio-Rad, Buehler, Carl Zeiss, CDE, CPS, CR Technology, DELTRONIC, Denton, Diagnostic Instruments, Digital Instruments, Dolan Jenner, Fostec, Four Dimensions, Frontier Semiconductor, Gaertner, GCA/Tropel, Hitachi, HMI, HSEB, J. A. Woollam, Karl Storz, KLA, KLA Tencor, KLA-Tencor, Leco, Leica, Leica, Leitz, Matrix Corp, McPherson, Melles Griot, Microspec, Mitutoyo, Nanometrics, Nicolet, Nikon, Nikon, Nova, Olympus, Orbotech, Plasmos, Reichert Inc, Reichert-Jung, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Semilab, Semprex, Solid State Measurement, Tencor, Veeco Instruments, Vision Engineering, Volpi, Well, Wild, Zeiss