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Item IDPhotoItem DescriptionMakeModelDescription#PriceNotes Location
$
203074 Applied Materials, ELITE M5 MC, 300mm, eBeam InspectionAMATElite M5 MCe-Beam Inspeciton 1 N* Dresden, Saxony
203075 Applied Materials, ELITE M5 MC, 300mm, eBeam InspectionAMATElite M5 MCe-Beam Inspeciton 1 N* Santa Clara, California
195987 Bruker, D8FABLINE, 300mm, X-Ray MetrologyBrukerD8FablineX-Ray Metrology 1 Singapore
199447 Bruker, D8FABLINE, 300mm, X-Ray MetrologyBrukerD8 FablineXray Metrology 1 East Fishkill, New York
199986 HMI, eScan 320, 300mm, ebeam InspectionHermes MicroviseScan 320Ebeam Probe 1 F* Malta, New York
179748 MULTIPROBE MP1, Atomic Force Prober (AFP), 300mmMultiprobeMP1Atomic Force Prober (AFP) 1 F* Dresden, SN
182307 Suss Microtec BA300-MIT, 300mm Automated Inspection ToolSuss MicroTec BA300-MIT 1 F* Fishkill, New York
203138 Suss Microtec ABC 200, 200mm, Automated Bonding ToolSuss MicroTecABC 200Bonder Wafer/Glass 1 N* East Fishkill, New York
203130 Suss Microtec PA300-MIT, 300mm Automated Inspection ToolSuss MicroTecPA300-MITMold Inspection Microscope 1 N* East Fishkill, New York
203137 Suss Microtec XBC 300, 300mm, Automated Bonding ToolSuss MicroTecXBC300Bonder 1 N* East Fishkill, New York
202877 VEECO (Bruker Nano), D3100, AFMVeecoD3100Conductive AFM - 1 N* Singapore
191172 VEECO (Bruker Nano), X-1D, AFM, 300mmVeecoX-1D ATOMIC FORCE MICROSCOPE (AFM) 1 F* Dresden, Saxony
191173 VEECO (Bruker Nano), X-3D, AFM, 300mmVeecoX-3D AFMAtomic Force Microscope (AFM) 1 Dresden, Saxony
191174 VEECO (Bruker Nano), X-3D, AFM, 300mmVeecoX-D3 AFMAtomic Force Microscope (AFM) 1 F* Dresden, Saxony

NOTE:
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  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Other Items:
Suss MicroTec