 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
| Make |
Model |
| |
|
$ |
|
 |
255041
|
KLA Tencor
|
KLA Tencor |
2367 |
in Microscope Inspection Tools
KLA 2367 "Escape" Bright Field Inspection Tool:BrightField Inspektionstool
25 cassette HW 200mm
GEM/SECS and HSMS Model
Enable .12 , .62, .39 Picels ORS Upgrade done Tool currently full installed at cleanroom (estimated time depending on areaneed)
|
1
|
|
|
 |
Regensburg, Bavaria |
|
|
252332
|
KLA Tencor
|
KLA Tencor |
DSW16E |
in Metrology Equipment
KLA-Tencor DSW16E 300mm Calibration Wafer:KLA-Tencor DSW16E 300mm Calibration Wafer - Part Number 0210691-000 (Advanced Technology Development)
- For Use on e-Beam Patterned Wafer Defect Inspection Tools
|
1
|
|
|
|
Plano, Texas |
|
|
106858
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
81-86680 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 81-86680:Motor, Rotator DC w/Gearbox
|
1
|
|
|
|
Hudson, NY |
|
|
146781
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
91-0011 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 91-0011:Coupling Body 1/8" Barb
|
2
|
|
|
|
Hudson, NY |
|
|
146782
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
91-0013 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 91-0013:Coupling Insert 1/8" Barb
|
2
|
|
|
|
Hudson, NY |
|
|
146793
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
96-0002 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 96-0002:Regulator Preset 15psi
|
1
|
|
|
|
Hudson, NY |
|
|
255557
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420 #420:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
|
Regensburg, Bavaria |
|
|
255558
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420 (MET920-01):›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
|
Regensburg, Bavaria |
|
|
255559
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420 #419:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
|
Regensburg, Bavaria |
|
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