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Displaying 1-100 of 222  Page    1  2  3

	Item ID	Photo	Short Description		Product Type / Details	#		Price	Notes	Location
			Make	Model
								$
	251076	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Critical Dimension Measurement Equipment	1				Singapore
	254249	AMAT	AMAT	UVision 6	Wafer Inspection Microscopes in Optical Microscopes	1				Malta, New York
	254250	AMAT	AMAT	UVision 6	Wafer Inspection Microscopes in Optical Microscopes	1				Malta, New York
	252611	Applied Materials	Applied Materials	Verity1 SEM	Scanning Electron Microscopes in Electron Microscopy AMAT Verity1 SEM, 300mm, s/n: U-757: Applied VeritySEM	1				Singapore
	248208	Applied Materials	Applied Materials	G3 Lite	Scanning Electron Microscopes in Electron Microscopy AMAT, G3 Lite, 300mm, S/N W3041: AMAT, G3 Lite, 300mm, S/N W3041	1				Singapore
	111048	American Optical	American Optical	1177-1	Fiber Optic Light Sources in Fiber Optic Illuminators AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	2		195.05		Scotia, New York
	171583	Anatech Ltd	Anatech Ltd	Hummer 6.6T	Sample Coaters in Sample Preparation ANATECH HUMMER 6.6T SPUTTER SYSTEM: Sputter System	1			F*	Scotia, New York
	184614	ATM GmbH	ATM GmbH	Brillant BR250.2	Cut-Off Saws in Slicing Saws ATM GmbH CUT OFF SAW 12" : Cut-Off Saw	1			F*	Scotia, New York
	1786	Bausch & Lomb	Bausch & Lomb	Type A	Stands in Parts and Accessories, Microscope BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND: Type A Incident Light Stand Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope	12				Scotia, New York
	1785	Bausch & Lomb	Bausch & Lomb	312690	Parts and Accessories - Other in Parts and Accessories, Microscope BAUSCH & LOMB ER-ARM: ER-Arm Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope	10		180.05	F*	Scotia, New York
	208308	Bausch and Lomb	Bausch and Lomb	MicroZoom	Upright Microscopes in Optical Microscopes BAUSCH & LOMB INDUSTRIAL MICROSCOPE INCIDENT LIGHT: Industrial microscope with long working distance objectives.	1			F*	Scotia, New York
	964	Bausch & Lomb	Bausch & Lomb	MicroZoomII	Microscopes - Other in Optical Microscopes BAUSCH & LOMB MICROSCOPE WORK STATION: Microscope Work Station Long working distance objectives	1				Scotia, New York
	3264	Bausch & Lomb	Bausch & Lomb	StereoZoom 1	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X: Stereo Zoom Microscope Microscopes listed are for pod and eyepieces only	13		225.06		Scotia, New York
	110365	Bausch & Lomb	Bausch & Lomb	StereoZoom 2	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 2X: Stereo Zoom Microscope   Microscopes listed are for pod and eyepieces only	1		350.09		Scotia, New York
	1800	Bausch & Lomb	Bausch & Lomb	StereoZoom 5	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X: Stereo Zoom Microscope Scopes listed include pod and eyepieces only	1		600.16		Scotia, New York
	159266	Bausch & Lomb	Bausch & Lomb	SZ4	Stereo Microscopes in Optical Microscopes Bausch & Lomb Stereo Zoom 4: StereoZoom 4 Microscope with Boom Stand	1			F*	Plano, TX
	161016	Bausch & Lomb	Bausch & Lomb	StereoZoom 4	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 4: Microscope on Small Base	1				Plano, TX
	161018	Bausch & Lomb	Bausch & Lomb	StereoZoom 6 Plus	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6 Plus: Microscope Head	1			F*	Plano, TX
	159267	Bausch & Lomb	Bausch & Lomb	SZ 6-ST	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6-ST: StereoZoom Microscope with Boom Stand	1				Plano, TX
	157435	Bausch & Lomb	Bausch & Lomb	StereoZoom 7	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB StereoZoom 7: Microscope & Boom Stand	1			F*	Plano, TX
	110364	Bausch & Lomb	Bausch & Lomb	Type K	Stands in Parts and Accessories, Microscope BAUSCH & LOMB TYPE K STAND: K Stand for B&L StereoZoom Microscopes Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope E-Arm not included	1				Scotia, New York
	109122	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	19			F*	Scotia, New York
	109425	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand w/ Rectangular Horizontal Post Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	6				Scotia, New York
	109549	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand w/ Rotatable Knuckle Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	109553	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	109427	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Dual Arm Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2		350.09		Scotia, New York
	209828	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology	1				Malta, New York
	4436	Buehler	Buehler	Consumables	Polishing & Grinding Sample Prep Equipment in Sample Preparation BUEHLER CONSUMABLES, POLISHING AND GRINDING: Polishing and Grinding Consumables	4				Scotia, NY
	122523	Buehler	Buehler	Dressing Chuck	Cut-Off Saws in Slicing Saws BUEHLER ISOMET DRESSING CHUCK: Dressing Chuck Representative photos	1			F*	Scotia, New York
	142877	Buehler	Buehler	ISOMET	Cut-Off Saws in Slicing Saws BUEHLER LOW SPEED CUT-OFF SAW: Precision Sectioning Saw Representative photo - color of saw may vary Various ISOMET chucks available.  See other information for more details.	2			F*	Scotia, New York
	116574	Buehler	Buehler	Primet	Sample Preparation - Other in Sample Preparation BUEHLER PRIMET MODULAR DISPENSING SATELLITE: Modular Dispensing Satellite	1			F*	Scotia, New York
	7353	CPS	CPS	6004/1958	Scanning Electron Microscopes in Electron Microscopy CPS SEM ELECTRON GUN POWER SUPPLY 30KV: Electron Gun Power Supply CPS SEM Power Supply 6004	1		3,751.00		Scotia, New York
	28680	Dage-MTI	Dage-MTI	SERIES 68	Cameras and Controllers in Optical Microscopes DAGE-MTI SERIES 68 INFRARED CAMERA: Infrared Camera	2		1,100.29		Scotia, New York
	194899	DELTRONIC	DELTRONIC	DH14-RR	Measuring Microscopes in Optical Microscopes Deltronic DH14-RR Profile Projector : Deltronic DH14-RR Profile Projector  20X Objective Lens	1				Plano, Texas
	57426	Denton	Denton	DESK II	Sample Coaters in Sample Preparation DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP : Metal Sputter	1		6,251.67	F*	Scotia, New York
	159268	Diagnostic Instrumts	Diagnostic Instrumts		Stereo Microscopes in Optical Microscopes Diagnostic Instruments: Microscope Boom Stand	2				Plano, TX
	109548	Diagnostic Instrumts	Diagnostic Instrumts	SMS16-A	Stands in Parts and Accessories, Microscope DIAGNOSTIC INSTRUMENTS BOOM STAND: Weighted Base Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	86452	Diagnostic Instrumts	Diagnostic Instrumts	SMS16-B	Stands in Parts and Accessories, Microscope DIAGNOSTIC INSTRUMENTS BOOM STAND: Boom Stand	1		325.09	F*	Scotia, New York
	18711	Dolan Jenner	Dolan Jenner	180	Fiber Optic Light Sources in Fiber Optic Illuminators DOLAN JENNER FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	1		150.04	F*	Scotia, New York
	122729	Dolan Jenner	Dolan Jenner	PL-750A- 111	Fiber Optic Light Sources in Fiber Optic Illuminators DOLAN JENNER FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	1		225.06	F*	Scotia, NY
	134541	FIBER OPTIC LIGHT SOURCE	FIBER OPTIC LIGHT SOURCE		Fiber Optic Light Sources in Fiber Optic Illuminators FIBER OPTIC LIGHT SOURCE: Remote Fiber Optic Illuminator Model FOI-150-Remote	1		180.05		Scotia, New York
	134624	FIBER OPTIC LIGHT SOURCE	FIBER OPTIC LIGHT SOURCE		Fiber Optic Light Sources in Fiber Optic Illuminators FIBER OPTIC LIGHT SOURCE: Fiber Optic Illuminator Manufacturer Unknown	1		180.05		Scotia, New York
	49926	GCA/Tropel	GCA/Tropel	9000	Unpatterned Wafer Inspection in Surface Inspection GCA/TROPEL 9000: Surface Flatness Analyzer	1				Plano, TX
	251067	HIMS	HIMS	HPI-1000	Wafer Inspection Microscopes in Optical Microscopes HIMS HPI-1000, 200mm, s/n: 2605-W08-PI001: TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02)	1				Singapore
	251068	HIMS	HIMS	HPI-1000	Wafer Inspection Microscopes in Optical Microscopes HIMS HPI-1000, 200mm, s/n: 2605-W08-PI001: TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02)	1				Singapore
	35762	Hitachi	Hitachi	S-7000	Critical Dimension Scanning Electron Microscopes in Critical Dimension Measurement Equipment Hitachi S-7000: CD SEM Measurement Tool	1			F*	Plano, TX
	237745	HMI	HMI	eScan 500	Scanning Electron Microscopes in Electron Microscopy HMI eScan 500, sn: ML07114, Defect Review, 300mm: HMI eScan 500, sn: ML07114, Defect Review, 300mm	1				Malta, New York
	251081	HMI	HMI	ESCAN380	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	253752	HSEB	HSEB	MMT 300	Wafer Inspection Microscopes in Optical Microscopes	1				Dresden, Saxony
	253234	HSEB	HSEB	MMT300 V2	Wafer Inspection Microscopes in Optical Microscopes	1				Dresden, Saxony
	202816	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3.	1				Malta, New York
	202817	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm	1				Malta, New York
	254223	Jordan Valley JVX6200i, 300mm, s/n: M872	Jordan Valley JVX6200i, 300mm, s/n: M872		Other Items in Microscopes	1				Malta, New York
	332	Karl Storz	Karl Storz	483C	Parts and Accessories - Other in Parts and Accessories, Microscope KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE : Twin Fiber Optic Light Source Light guide not included.	1		350.09		Scotia, New York
	251079	KLA-Tencor	KLA-Tencor	AITXUV	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	251077	KLA-Tencor	KLA-Tencor	AITXUV	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	254255	KLA-Tencor	KLA-Tencor	2835	Wafer Inspection Microscopes in Optical Microscopes KLA 2835, 300mm, s/n: 1340334: Brightfield Inspection	1				Malta, New York
	251078	KLA-Tencor	KLA-Tencor	AITXUV	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	251080	KLA-Tencor	KLA-Tencor	AITXUV	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	251617	KLA-Tencor	KLA-Tencor	AITXUV	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	237748	KLA-Tencor	KLA-Tencor	AMI2900	Wafer Inspection Microscopes in Optical Microscopes KLA AMI2900, sn: V000283, 300mm: KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module	1				Malta, New York
	254370	KLA-Tencor	KLA-Tencor	Shelby LD10	Wafer Inspection Microscopes in Optical Microscopes	1				Malta, New York
	254372	KLA-Tencor	KLA-Tencor	Spectra Film LD10	Wafer Inspection Microscopes in Optical Microscopes	1				Malta, New York
	254371	KLA-Tencor	KLA-Tencor	Spectra Film LD10	Wafer Inspection Microscopes in Optical Microscopes	1				Malta, New York
	252339	KLA-Tencor	KLA-Tencor	SPECTRACD-XT	Wafer Inspection Microscopes in Optical Microscopes	1				Singapore
	252340	KLA-Tencor	KLA-Tencor	SPECTRACD-XT	Wafer Inspection Microscopes in Optical Microscopes	1				Singapore
	253040	KLA-Tencor	KLA-Tencor	AIT II	Wafer Inspection Microscopes in Optical Microscopes KLA Tencor AIT II, 200mm, s/n: 9145: KLA-Tencor AIT II w/ ADC. Defect Inspection	1				Burlington, Vermont
	253033	KLA-Tencor	KLA-Tencor	AIT II	Wafer Inspection Microscopes in Optical Microscopes KLA Tencor AIT II, 200mm, s/n: 9234: AIT II w/ ADC. Defect Inspection Tool	1				Burlington, Vermont
	254150	KLA-Tencor	KLA-Tencor	OP2600DUVI	Wafer Inspection Microscopes in Optical Microscopes KLA Tencor OP2600DUVI, 200mm, s/n: 6454: Film thickness measurement	1				Singapore
	254149	KLA-Tencor	KLA-Tencor	OP3260I	Wafer Inspection Microscopes in Optical Microscopes KLA Tencor OP3260I, 200mm, s/n: 6678: Film thickness measurement	1				Singapore
	254148	KLA-Tencor	KLA-Tencor	OP5240I	Wafer Inspection Microscopes in Optical Microscopes	1				Santa Clara, California
	254147	KLA-Tencor	KLA-Tencor	UV1280SE	Wafer Inspection Microscopes in Optical Microscopes KLA Tencor UV1280SE, 200mm, s/n: 991098: Film thickness measurement tool	1				Singapore
	254018	KLA-Tencor	KLA-Tencor	2138XP	Automatic Wafer Inspection Tools in Microscope Inspection Tools KLA-Tencor 2138XP Brightfield Inspection Tool: KLA-Tencor 2138XP Brightfield Defect Inspection Tool 0.25µ, 0.39µ, 0.62µ Spot Sizes For 150mm & 200mm Wafers Model 2552UI User Interface Denkenseiki Noise Filter Please Inquire for Additional Details	1				Austin, Texas
	253038	KLA-Tencor	KLA-Tencor	AIT II	Wafer Inspection Microscopes in Optical Microscopes KLA-Tencor AIT II, 200mm, s/n: 9152: AIT II w/ ADC. Defect Inspection	1				Burlington, Vermont
	253037	KLA-Tencor	KLA-Tencor	AIT II	Wafer Inspection Microscopes in Optical Microscopes KLA-Tencor AIT II, 200mm, s/n: 9262: AIT II w/ ADC. Defect Inspection Tool	1				Burlington, Vermont
	218321	KLA-Tencor	KLA-Tencor	AIT	Patterned Wafer Inspection in Surface Inspection KLA-Tencor AIT Patterned Wafer Inspection Tool: KLA-Tencor AIT Patterned Wafer Inspection Tool Call for Details	1				Plano, Texas
	253039	KLA-Tencor	KLA-Tencor	AIT	Wafer Inspection Microscopes in Optical Microscopes	1				Burlington, Vermont
	254084	KLA-Tencor	KLA-Tencor	EDR 5200	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	254087	KLA-Tencor	KLA-Tencor	EDR 5210	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	254086	KLA-Tencor	KLA-Tencor	EDR 5210	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	254085	KLA-Tencor	KLA-Tencor	EDR 5210	Scanning Electron Microscopes in Electron Microscopy	1				Singapore
	5310	KLA-Tencor	KLA-Tencor	7700	Patterned Wafer Inspection in Surface Inspection KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER: Patterned Wafer Contamination Analyzer Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films Capable of measuring defects on unpatterned wafers Capable of measuring wafers from 4” to 8” High sensitivity on after-etch and high topography applications Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers	1			F*	Scotia, New York
	250818	KLA-Tencor	KLA-Tencor	Puma 9120 IS	Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool: KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool For 200mm or 300mm Wafers 2ea Cameras Please Inquire for Additional Details	1				Austin, Texas
	250819	KLA-Tencor	KLA-Tencor	Puma 9130	Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Puma 9130 Darkfield Inspection Tool: KLA-TENCOR Puma 9130 Darkfield Inspection Tool Parts Tool Please Inquire for Additional Details	1				Austin, Texas
	250814	KLA-Tencor	KLA-Tencor	Surfscan SP1	Unpatterned Wafer Inspection in Surface Inspection KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool: KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool Dual Port 300mm	1				Plano, Texas
	250815	KLA-Tencor	KLA-Tencor	Surfscan SP1	Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too: KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool Dual Port 200mm	1				Plano, Texas
	250816	KLA-Tencor	KLA-Tencor	Surfscan SP3+	Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Surfscan SP3+ Unpatterned Surface Defect Tool: KLA-TENCOR Surfscan SP3+ Unpatterned Wafer Surface Defect Tool DUV Illumination Particle Detection to 32nm Dual 300mm FOUP Loadports Please Inquire for Additional Details	1				Austin, Texas
	1127	Leco	Leco	VC-50	Cut-Off Saws in Slicing Saws LECO PRECISION DIAMOND CUT OFF SAW 5" BLADE: Vari/Cut Off Saw	1			F*	Scotia, New York
	18713	Fostec	Fostec	8300	Fiber Optic Light Sources in Fiber Optic Illuminators LEEDS FOSTEC FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source Representative photo These units are manufactured by Fostec and re-branded by different companies. The light source received may not be branded Fostec.	19			F*	Scotia, New York
	186519	Leica	Leica	INM20	Wafer Inspection Microscopes in Optical Microscopes LEICA AUTOMATED WAFER INSPECTION MICROSCOPE: Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system	1			F*	Scotia, New York
	1893	Leica	Leica	445945	Parts and Accessories - Other in Parts and Accessories, Microscope LEICA E-ARM FOCUSING DRIVE: Focusing Drive For MS5/MZ6/MZ8	9			F*	Scotia, New York
	243053	Leica	Leica	Polylite 88	Upright Microscopes in Optical Microscopes LEICA REICHERT BRIGHTFIELD DARKFIELD : Long Working Distance Objectives	1			F*	Scotia, New York
	165299	Leica	Leica	S6 E	Stereo Microscopes in Optical Microscopes LEICA STEREO MICROSCOPE 6.3X - 40X: Stereo Microscope with Boom Stand and Ring Light	1		1,550.42	F*	Scotia, New York
	192026	Leica	Leica	S6 E	Stereo Microscopes in Optical Microscopes LEICA STEREO MICROSCOPE 6.3X - 40X: Stereo Microscope with Boom Stand, Dual Light Pipes & .75X Aux lens	1		1,725.46	F*	Scotia, New York
	37954	Leica	Leica	INM 100	Upright Microscopes in Optical Microscopes LEICA WAFER INSPECTION MICROSCOPE, BRIGHT & DARKFIELD: Wafer Inspection Microscope New, never used	1			F*	Scotia, New York
	169430	Leica	Leica	Wild M8	Stereo Microscopes in Optical Microscopes LEICA WILD STEREO MICROSCOPE 6X - 50X: Stereo Microscope	1				Scotia, New York
	1643	Leica	Leica	POLYLITE88	Upright Microscopes in Optical Microscopes LEICA/REICHERT METALLURGICAL MICROSCOPE: Metallurgical Microscope - Camera and controller not included	1			F*	Scotia, New York
	1641	Leica	Leica	POLYLITE 88	Wafer Inspection Microscopes in Optical Microscopes LEICA/REICHERT MICROSCOPE, MANUAL WAFER INSPECTION : Manual Wafer Inspection Microscope MicroVision MVT 1080 Wafer Loader	1			F*	Scotia, New York
	106575	Leica	Leica	Polylite 88	Upright Microscopes in Optical Microscopes LEICA/REICHERT MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD: Polylite 88 Reflected Light Microscope	2			F*	Scotia, New York
	186513	Leica	Leica	POLYLITE 88	Wafer Inspection Microscopes in Optical Microscopes LEICA/REICHERT WAFER INSPECTION MICROSCOPE: Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system	1				Scotia, New York
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Wafer Inspection Tools: AMAT, American Optical, Anatech Ltd, Applied Materials, Inc., ATM GmbH, Bausch & Lomb, Inc, Bausch and Lomb, Buehler, Carl Zeiss, CPS, Dage-MTI, DELTRONIC, Denton, Diagnostic Instruments, Dolan Jenner, Fostec, GCA/Tropel, HIMS, Hitachi, HMI, HSEB, Karl Storz, KLA-Tencor, Leco, Leica, Leica, Leitz, Melles Griot, Microspec, Mitutoyo, Nikon, Nikon, Olympus, Reichert Inc, Reichert-Jung, Rudolph Technologies, Inc., Semprex, Tencor, Vision Engineering, Volpi, Well, Wild, Zeiss