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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
179175
Applied Materials  

Applied Materials  

Compass 200mm 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Regensburg, Bavaria
AMAT Compass 200mm:

COMPASS PRO* – INCREASING SENSITIVITY AND THROUGHPUT

FOR 100NM CHALLENGES

Addressing the increasing need for higher sensitivity at

higher throughputs, the CompassPro introduces new features

targeted at grainy layers, complex devices such as combined

logic and memory, and more accurate die-to-die precision,

resolution and defect reporting. Additionally, CompassPro

optimizes performance on copper and low-k with predefined

recipes. CompassPro patterned wafer inspection

technology helps our customers to actively engineer high

yield in the shortest possible time. The “Pro-active”

approach provides an un-rivaled solution set for patterned

wafer inspection in the nanometer era.

163973
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Regensburg, BY
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL
163974
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Regensburg, BY
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL
163975
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Regensburg, BY
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection
2x 300mm Load Ports Asyst SMIF-300FL
Tool already disassembled.
111048
American Optical  

American Optical  

1177-1 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

2 195.00 F* Scotia, NY
AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
1895
American Optical  

American Optical  

570 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 525.00 Scotia, NY
AMERICAN OPTICAL STEREO MICROSCOPE 7X - 42X:
Stereo Zoom Microscope

(stand not included)

 

1894
American Optical  

American Optical  

580 

List all items of this typeStereo Microscopes

in Optical Microscopes

2 550.00 Scotia, New York
AMERICAN OPTICAL STEREO ZOOM MICROSCOPES 10X - 60X:
Stereo Zoom Microscope

(stand and arm not included)

 

171583
Anatech Ltd  

Anatech Ltd  

Hummer 6.6T 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, NY
ANATECH HUMMER 6.6T SPUTTER SYSTEM:
Sputter System
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
201736
Applied Materials  

Applied Materials  

VeritySEM 5i 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   Albany, New York
Applied Materials, Verity SEM 5i, CD SEM, 300mm:

Applied Materials, Verity SEM 5i, CD SEM, 300mm

Installed.  Working

184614
ATM GmbH  

ATM GmbH  

Brillant BR250.2 

List all items of this typeCut-Off Saws

in Slicing Saws

1   F* Scotia, NY
ATM GmbH CUT OFF SAW 12" :
Cut-Off Saw
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

110163
BAL-TEC  

BAL-TEC  

SCD 050 

List all items of this typeSample Coaters

in Sample Preparation

1   Scotia, New York
BAL-TEC SAMPLE COATER/SPUTTER COATER SEM SAMPLE PREP:
Sputter Coater
1786
Bausch & Lomb  

Bausch & Lomb  

Type A 

List all items of this typeStands

in Parts and Accessories, Microscope

13 185.00 Scotia, NY
BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:
Type A Incident Light Stand

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
1785
Bausch & Lomb  

Bausch & Lomb  

312690 

List all items of this typeParts and Accessories - Other

in Parts and Accessories, Microscope

10 180.00 F* Scotia, New York
BAUSCH & LOMB ER-ARM:
ER-Arm

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
964
Bausch & Lomb  

Bausch & Lomb  

MicroZoomII 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1 4,000.00 Scotia, NY
BAUSCH & LOMB MICROSCOPE WORK STATION:
Microscope Work Station

Long working distance objectives

 

146
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

248
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope with Camera
3264
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 1 

List all items of this typeStereo Microscopes

in Optical Microscopes

13 225.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:
Stereo Zoom Microscope

Microscopes listed are for pod and eyepieces only

 

110365
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 2 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 350.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 2X:
Stereo Zoom Microscope

 



Microscopes listed are for pod and eyepieces only

 

145
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 7X - 30X:
Stereo Zoom Microscope

Pod color may vary
Microscopes listed are for pod and eyepieces only

 

1800
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 5 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 600.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

159266
Bausch & Lomb  

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb Stereo Zoom 4:
StereoZoom 4 Microscope with Boom Stand
161016
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 4:
Microscope on Small Base
161018
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb StereoZoom 6 Plus:
Microscope Head
159267
Bausch & Lomb  

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 6-ST:
StereoZoom Microscope with Boom Stand
157435
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
BAUSCH & LOMB StereoZoom 7:
Microscope & Boom Stand
110364
Bausch & Lomb  

Bausch & Lomb  

Type K 

List all items of this typeStands

in Parts and Accessories, Microscope

1 235.00 Scotia, NY
BAUSCH & LOMB TYPE K STAND:
K Stand for B&L StereoZoom Microscopes

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
E-Arm not included
109598
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

4 300.00 Scotia, NY
BOOM STAND:
Table Clamp Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109648
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109553
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109554
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109122
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

19 350.00 F* Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109425
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

6 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rectangular Horizontal Post

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109427
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Dual Arm Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109549
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rotatable Knuckle

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
195987
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   Singapore
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology


199447
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology

S/N 204500

2009 

The tool is an automated High resolution X-ray diffractometer, clean room
(class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300
mm wafer mapping capabilities.
The D8 FABLINE consists of two stainless steal cabinets attached to each
other.
The first one is an X-ray analytical module composed of: radiation safe
enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated
optical set-ups, and all required supplies. The second is a handling module
Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers
are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP
insert for 200mm..
185800
Buehler  

Buehler  

SimpliMet 1000 

List all items of this typeMounting Press

in Sample Preparation

1 4,950.00 F* Scotia, NY
BUEHLER AUTOMATIC MOUNTING PRESS 1" TO 2" CAPACITY:
Automatic Mounting Press
23007
Buehler  

Buehler  

Carbimet Paper Discs 

List all items of this typeSample Preparation - Other

in Sample Preparation

2 50.00 F* Scotia, NY
BUEHLER CARBIMET 320 GRIT PAPER DISCS:
Paper Discs 320 Grit

Buehler part number: 30-5108-320-100
4436
Buehler  

Buehler  

Consumables 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

4   Scotia, NY
BUEHLER CONSUMABLES, POLISHING AND GRINDING:
Polishing and Grinding Consumables
122523
Buehler  

Buehler  

Dressing Chuck 

List all items of this typeCut-Off Saws

in Slicing Saws

2 185.00 F* Scotia, NY
BUEHLER ISOMET DRESSING CHUCK:
Dressing Chuck

142877
Buehler  

Buehler  

ISOMET 

List all items of this typeCut-Off Saws

in Slicing Saws

4 3,350.00 F* Scotia, New York
BUEHLER LOW SPEED CUT-OFF SAW:
Precision Sectioning Saw

Representative photo - color of saw may vary

Various ISOMET chucks available. 
See other information for more details.
116574
Buehler  

Buehler  

Primet 

List all items of this typeSample Preparation - Other

in Sample Preparation

1 650.00 F* Scotia, NY
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:
Modular Dispensing Satellite

147703
Buehler  

Buehler  

48-1573GGG-R 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1 3,850.00 F* Scotia, NY
BUEHLER THREE POSITION POLISHING BENCH :
Three Position Polishing Bench

7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
28680
Dage-MTI  

Dage-MTI  

SERIES 68 

List all items of this typeCameras and Controllers

in Optical Microscopes

2 1,200.00 Scotia, NY
DAGE-MTI SERIES 68 INFRARED CAMERA:
Infrared Camera
194899
DELTRONIC  

DELTRONIC  

DH14-RR 

List all items of this typeMeasuring Microscopes

in Optical Microscopes

1   Plano, Texas
Deltronic DH14-RR Profile Projector :
Deltronic DH14-RR Profile Projector 
  • 20X Objective Lens
194900
Denton  

Denton  

Desk II 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Plano, Texas
Denton Desk II SEM Sample Coater:
Denton Desk II SEM Sample Coater
  • 5.375" (dia.) X 9" (h) Chamber
  • Carbon Rod Accessory
57426
Denton  

Denton  

DESK II 

List all items of this typeSample Coaters

in Sample Preparation

1 6,250.00 F* Scotia, New York
DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :
Metal Sputter

159268
Diagnostic Instrumts  

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

2   Plano, TX
Diagnostic Instruments:
Microscope Boom Stand
86452
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-B 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Boom Stand
109548
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-A 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Weighted Base Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes

Available only with purchase of a Stereozoom Microscope
E-arm not included

43778
Diagnostic In  

Diagnostic In  

SMS20 

List all items of this typeStands

in Parts and Accessories, Microscope

1 1,075.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS SMS20:
Boom Stand

Stands can be fitted for B&L Stereo Zoom Microscopes, Leica Stereozoom Microscopes and Nikon Stereo Zoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
18711
Dolan Jenner  

Dolan Jenner  

180 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 150.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
122729
Dolan Jenner  

Dolan Jenner  

PL-750A- 111 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 225.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source

200228
E.A. Fischione Instr  

E.A. Fischione Instr  

1040 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* East Fishkill, New York
E.A. Fischione Instruments Inc., 1040, NanoMill:
E.A. Fischione Instruments Inc., 1040, NanoMill
4499
Edwards  

Edwards  

S150 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, New York
EDWARDS CARBON EVAPORATION SOURCE:
Carbon Evaporation Source
181557
FEI  

FEI  

200XP TMP 

List all items of this typeFocused Ion Beam Tools

in Ion Beam Equipment

1   F* Scotia, New York
FEI FOCUSED ION BEAM SYSTEM:
Focus Ion Beam System

The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* East Fishkill, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


199967
FEI  

FEI  

Titan 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, TITAN, Advanced Analytical TEM, :
FEI, TITAN, Advanced Analytical TEM, 

S/N : SN#D3209
134541
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, New York
FIBER OPTIC LIGHT SOURCE:
Remote Fiber Optic Illuminator

Model FOI-150-Remote
134624
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, New York
FIBER OPTIC LIGHT SOURCE:
Fiber Optic Illuminator

Manufacturer Unknown
176740
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, New York
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS).

Includes Gatan Binocular Microscope

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

175315
Gatan  

Gatan  

681 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, New York
GATAN ION BEAM COATER (IBC):
Ion Beam Coater

Ion Beam Coater (IBC) designed to produce high-quality conductive coatings on

SEM or TEM specimens
49926
GCA/Tropel  

GCA/Tropel  

9000 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

1   Plano, TX
GCA/TROPEL 9000:
Surface Flatness Analyzer
202146
Hitachi  

Hitachi  

HF-2000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* East Fishkill, New York
Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging

200KeV Advanced Analytical TEM  

1995 Vintage

S/N : 6214-3

Un-hooked in lab.

100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Plano, TX
Hitachi S-7000:
CD SEM Measurement Tool
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Singapore
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:
Hitachi, S-9380II, CD-SEM, 300mm

!!! Multiple Units Available!!!  Please Inquire
201533
Hitachi  

Hitachi  

S-9380 II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

Completely Refurbished 

S/N : 2145-06

201534
Hitachi  

Hitachi  

S-9380 II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

S/N : 2160-02

Completely Refurbished

178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
201150
Hitachi  

Hitachi  

CG5000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   Dresden, Saxony
Hitachi. CG5000, 300mm CD SEM:
Hitachi. CG5000, 300mm CD SEM

S/N : 61C3-01
199446
HMI, EP3, 300mm, E-Beam Inspection System 
HMI, EP3, 300mm, E-Beam Inspection System 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
HMI, EP3, 300mm, E-Beam Inspection System:
HMI, EP3, 300mm, E-Beam Inspection System
199986
HMI, eScan 320, 300mm, ebeam Inspection 
HMI, eScan 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

1   F* Malta, New York
HMI, eScan 320, 300mm, ebeam Inspection:
HMI, eScan 320, 300mm, ebeam Inspection
201829
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Dresden, Saxony
HSEB Axiospect 300, 300mm Wafer inspection microscope:

HSEB Axiospect 300, 300mm Wafer inspection microscope

 

S/N : 41302020168

199709
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Dresden, Saxony
HSEB, Axiospect 300, Optical Microscope, 300mm:
HSEB, Axiospect 300, Optical Microscope, 300mm
199710
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Dresden, Saxony
HSEB, Axiospect 300, Optical Microscope, 300mm:

HSEB, Axiospect 300, Optical Microscope, 300mm
Cold Offline

!!! Multiple Units Available !!! Please inquire.

54074
Irvine Optical  

Irvine Optical  

UltraSpec III 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   Plano, TX
Irvine Optical UltraSpec III:
Wafer Inspection Station
136281
Irvine Optical Co.  

Irvine Optical Co.  

UltraSpec III 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   Plano, TX
Irvine Optical UltraSpec III Wafer Inspection Station:
Irvine Optical UltraSpec III Wafer Inspection Station
131723
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   Plano, TX
IRVINE OPTICAL Ultrastation 3:
Macro Inspection Tool
184441
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   Plano, TX
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope:
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • Automatic Wafer Loading for up to 200mm Wafers
  • LED Display and Extended Control Keyboard
  • Nikon CF Plan Optics; 5X, 10X, 20X, 50X & 150X B/Dfield Objectives
  • Differential Interference Contrast 
  • Ergonomic Trinocular Head with CFWN 10X/20 Eyepieces
  • Motic Moticam 1000 USB Camera
  • Nikon LHS-H100P-1 Lamphouse
  • 12V 100W Halogen Lamp
184442
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   Plano, TX
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope:
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • Automatic Wafer Loading for up to 200mm Wafers
  • LED Display and Standard Control Keyboard
  • Motorized Turret with Nikon BD Plan Optics
    • 5X, 10X, 40X & 100X B/Dfield Objectives
  • Ergonomic Trinocular Head with UW 10X/25 Eyepieces
  • Nikon Lamphouse with 12V 100W Halogen Lamp
194902
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Plano, Texas
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope:
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • For up to 20omm Wafers
  • Nikon CF Optical System
  • 5X, 10X, 20X & 50X Objective Lenses
  • 10X WF Eyepieces
  • 12V 100W Halogen Lamp
6402
JEOL  

JEOL  

JSM 6100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Microscope with LaB Filament
77955
JEOL  

JEOL  

JWS-7505ZH 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Plano, TX
Jeol JWS-7505ZH:
Critical Dimension Scanning Electron Microscope
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Wafer Inspection Tools:
American Optical, Anatech Ltd, Applied Materials Inc., Applied Materials, Inc., ATM GmbH, BAL-TEC, Bausch & Lomb, Inc, Buehler, CPS, Dage-MTI, DELTRONIC, Denton, Diagnostic Instruments, Dolan Jenner, E.A. Fischione Instr, Edwards, FEI, Fostec, Gatan, GCA/Tropel, Hitachi, HSEB, Irvine Optical Company, JEOL, Karl Storz, KLA-Tencor, Leco, Leica, Leica, Leitz, MASS-PCB, Melles Griot, Microspec, Mitutoyo, Nikon, Nikon, Olympus, Park Systems Inc, Prior Scientific, Reichert Inc, Reichert-Jung, RK Print Coat Instruments, Schott Fostec, SELA, Semprex, Strasbaugh, Suss MicroTec, Vision Engineering, Volpi, Wild, Zeiss