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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
111048
American Optical  

American Optical  

1177-1 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
2 195.00 F* Scotia, NY
1895
American Optical  

American Optical  

570 

List all items of this typeStereo Microscopes

in Optical Microscopes

AMERICAN OPTICAL STEREO MICROSCOPE 7X - 42X:
Stereo Zoom Microscope

(stand not included)

 

1 525.00 Scotia, NY
1894
American Optical  

American Optical  

580 

List all items of this typeStereo Microscopes

in Optical Microscopes

AMERICAN OPTICAL STEREO ZOOM MICROSCOPES 10X - 60X:
Stereo Zoom Microscope

(stand and arm not included)

 

2 550.00 Scotia, New York
171583
Anatech Ltd  

Anatech Ltd  

Hummer 6.6T 

List all items of this typeSample Coaters

in Sample Preparation

ANATECH HUMMER 6.6T SPUTTER SYSTEM:

Sputter System

1   F* Scotia, New York
203103
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

1   East Fishkill, New York
203104
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

1   East Fishkill, New York
203105
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

1   East Fishkill, New York
203106
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

1   East Fishkill, New York
203107
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

1   East Fishkill, New York
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

1   F* East Fishkill, NY
180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

1   F* East Fishkill, NY
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
1   Dresden, Saxony
203074
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

1   Dresden, Saxony
203075
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

1   Dresden, Saxony
204039
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

Applied Materials, SEMVision G3, DR-SEM, 300mm:

Applied Materials, SEMVision G3, DR-SEM, 300mm

missing some of the PC's in the electronic rack

Bagged & Skidded in Warehouse

2006 Vintage

1   Taichung, Taichung City
184614
ATM GmbH  

ATM GmbH  

Brillant BR250.2 

List all items of this typeCut-Off Saws

in Slicing Saws

ATM GmbH CUT OFF SAW 12" :
Cut-Off Saw
1   F* Scotia, NY
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

1   F* Regensburg, BY
1806
Bausch & Lomb  

Bausch & Lomb  

Nicholas Illuminator 

List all items of this typeIlluminators - Other

in Illuminators, Microscope

B&L NICHOLAS ILLUMINATOR:

Includes Lamp, Linkage, and Variable Transformer

AVAILABLE ONLY WITH THE PURCHASE OF A B&L STEREOZOOM MICROSCOPE

1   Scotia, New York
110163
BAL-TEC  

BAL-TEC  

SCD 050 

List all items of this typeSample Coaters

in Sample Preparation

BAL-TEC SAMPLE COATER/SPUTTER COATER SEM SAMPLE PREP:
Sputter Coater
1   F* Scotia, New York
1786
Bausch & Lomb  

Bausch & Lomb  

Type A 

List all items of this typeStands

in Parts and Accessories, Microscope

BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:
Type A Incident Light Stand

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
13 185.00 Scotia, NY
1785
Bausch & Lomb  

Bausch & Lomb  

312690 

List all items of this typeParts and Accessories - Other

in Parts and Accessories, Microscope

BAUSCH & LOMB ER-ARM:
ER-Arm

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
10 180.00 F* Scotia, New York
964
Bausch & Lomb  

Bausch & Lomb  

MicroZoomII 

List all items of this typeMicroscopes - Other

in Optical Microscopes

BAUSCH & LOMB MICROSCOPE WORK STATION:
Microscope Work Station

Long working distance objectives

 

1 4,000.00 Scotia, NY
146
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

7   Scotia, New York
248
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope with Camera
1   Scotia, New York
3264
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 1 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:
Stereo Zoom Microscope

Microscopes listed are for pod and eyepieces only

 

13 225.00 Scotia, NY
110365
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 2 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB STEREO MICROSCOPE 2X:
Stereo Zoom Microscope

 



Microscopes listed are for pod and eyepieces only

 

1 350.00 Scotia, NY
145
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB STEREO MICROSCOPE 7X - 30X:
Stereo Zoom Microscope

Pod color may vary
Microscopes listed are for pod and eyepieces only

 

7   Scotia, New York
1800
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 5 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

1 600.00 Scotia, NY
159266
Bausch & Lomb  

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb Stereo Zoom 4:
StereoZoom 4 Microscope with Boom Stand
1   F* Plano, TX
161016
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 4:
Microscope on Small Base
1   Plano, TX
161018
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 6 Plus:
Microscope Head
1   F* Plano, TX
159267
Bausch & Lomb  

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 6-ST:
StereoZoom Microscope with Boom Stand
1   Plano, TX
157435
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB StereoZoom 7:
Microscope & Boom Stand
1   F* Plano, TX
110364
Bausch & Lomb  

Bausch & Lomb  

Type K 

List all items of this typeStands

in Parts and Accessories, Microscope

BAUSCH & LOMB TYPE K STAND:
K Stand for B&L StereoZoom Microscopes

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
E-Arm not included
1 235.00 Scotia, NY
109598
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

BOOM STAND:
Table Clamp Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
4 300.00 Scotia, NY
109648
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
1 325.00 Scotia, NY
109553
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
2 325.00 Scotia, NY
109554
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
2 325.00 Scotia, NY
109549
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

BOOM STAND:
Microscope Boom Stand w/ Rotatable Knuckle

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
2 350.00 Scotia, NY
109122
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
19 350.00 F* Scotia, NY
109425
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

BOOM STAND:
Microscope Boom Stand w/ Rectangular Horizontal Post

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
6 350.00 Scotia, NY
109427
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

BOOM STAND:
Dual Arm Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
2 350.00 Scotia, NY
204303
Bruker, AFM, 300mm, InSight,  
Bruker, AFM, 300mm, InSight,  

List all items of this typeOther Items

in Microscopes

Bruker, AFM, 300mm, InSight, :

Bruker, AFM, 300mm, InSight, 

 

In Fab.  Warm Idle

1   Malta, New York
204304
Bruker, D8 Discover, 300mm, X-Ray Metrology 
Bruker, D8 Discover, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

Bruker, D8 Discover, 300mm, X-Ray Metrology:

Bruker, D8 Discover, 300mm, X-Ray Metrology

 

In Lab,  Cold idle

1   F* Dresden, Saxony
195987
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology


1   Singapore
199447
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology

S/N 204500

2009 

The tool is an automated High resolution X-ray diffractometer, clean room
(class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300
mm wafer mapping capabilities.
The D8 FABLINE consists of two stainless steal cabinets attached to each
other.
The first one is an X-ray analytical module composed of: radiation safe
enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated
optical set-ups, and all required supplies. The second is a handling module
Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers
are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP
insert for 200mm..
1   East Fishkill, New York
185800
Buehler  

Buehler  

SimpliMet 1000 

List all items of this typeMounting Press

in Sample Preparation

BUEHLER AUTOMATIC MOUNTING PRESS 1" TO 2" CAPACITY:
Automatic Mounting Press
1 4,950.00 F* Scotia, NY
23007
Buehler  

Buehler  

Carbimet Paper Discs 

List all items of this typeSample Preparation - Other

in Sample Preparation

BUEHLER CARBIMET 320 GRIT PAPER DISCS:
Paper Discs 320 Grit

Buehler part number: 30-5108-320-100
2 50.00 F* Scotia, NY
4436
Buehler  

Buehler  

Consumables 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

BUEHLER CONSUMABLES, POLISHING AND GRINDING:
Polishing and Grinding Consumables
4   Scotia, NY
122523
Buehler  

Buehler  

Dressing Chuck 

List all items of this typeCut-Off Saws

in Slicing Saws

BUEHLER ISOMET DRESSING CHUCK:
Dressing Chuck

2 185.00 F* Scotia, NY
142877
Buehler  

Buehler  

ISOMET 

List all items of this typeCut-Off Saws

in Slicing Saws

BUEHLER LOW SPEED CUT-OFF SAW:
Precision Sectioning Saw

Representative photo - color of saw may vary

Various ISOMET chucks available. 
See other information for more details.
4 3,350.00 F* Scotia, New York
116574
Buehler  

Buehler  

Primet 

List all items of this typeSample Preparation - Other

in Sample Preparation

BUEHLER PRIMET MODULAR DISPENSING SATELLITE:
Modular Dispensing Satellite

1 650.00 F* Scotia, NY
147703
Buehler  

Buehler  

48-1573GGG-R 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

BUEHLER THREE POSITION POLISHING BENCH :
Three Position Polishing Bench

1 3,850.00 F* Scotia, NY
205918
Camtek  

Camtek  

X-ACT 

List all items of this typeMicroscopes - Other

in Optical Microscopes

CAMTEK X-ACT System with EM3:

CAMTEK X-ACT System with EM3

 

Idle.  Shut Down.

1   N* East Fishkill, New York
7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
1 3,750.00 Scotia, NY
28680
Dage-MTI  

Dage-MTI  

SERIES 68 

List all items of this typeCameras and Controllers

in Optical Microscopes

DAGE-MTI SERIES 68 INFRARED CAMERA:
Infrared Camera
2 1,200.00 Scotia, NY
194899
DELTRONIC  

DELTRONIC  

DH14-RR 

List all items of this typeMeasuring Microscopes

in Optical Microscopes

Deltronic DH14-RR Profile Projector :
Deltronic DH14-RR Profile Projector 
  • 20X Objective Lens
1   Plano, Texas
194900
Denton  

Denton  

Desk II 

List all items of this typeSample Coaters

in Sample Preparation

Denton Desk II SEM Sample Coater:
Denton Desk II SEM Sample Coater
  • 5.375" (dia.) X 9" (h) Chamber
  • Carbon Rod Accessory
1   F* Plano, Texas
57426
Denton  

Denton  

DESK II 

List all items of this typeSample Coaters

in Sample Preparation

DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :
Metal Sputter

1 6,250.00 F* Scotia, New York
159268
Diagnostic Instrumts  

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

Diagnostic Instruments:
Microscope Boom Stand
2   Plano, TX
86452
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-B 

List all items of this typeStands

in Parts and Accessories, Microscope

DIAGNOSTIC INSTRUMENTS BOOM STAND:
Boom Stand
1 325.00 F* Scotia, NY
109548
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-A 

List all items of this typeStands

in Parts and Accessories, Microscope

DIAGNOSTIC INSTRUMENTS BOOM STAND:
Weighted Base Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes

Available only with purchase of a Stereozoom Microscope
E-arm not included

2 350.00 Scotia, NY
43778
Diagnostic In  

Diagnostic In  

SMS20 

List all items of this typeStands

in Parts and Accessories, Microscope

DIAGNOSTIC INSTRUMENTS SMS20:
Boom Stand

Stands can be fitted for B&L Stereo Zoom Microscopes, Leica Stereozoom Microscopes and Nikon Stereo Zoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
1 1,075.00 F* Scotia, NY
18711
Dolan Jenner  

Dolan Jenner  

180 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
1 150.00 F* Scotia, NY
122729
Dolan Jenner  

Dolan Jenner  

PL-750A- 111 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source

1 225.00 F* Scotia, NY
203282
E.A. Fischione Instr  

E.A. Fischione Instr  

1030 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

E.A. Fischione Instruments Inc., 1030, NanoMill:

E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep.

Automated Sample Preparation System

 

 

1   East Fishkill, New York
203280
E.A. Fischione Instr  

E.A. Fischione Instr  

1060 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

E.A. Fischione Instruments Inc., 1060, NanoMill:

E.A. Fischione Instruments Inc., 1060, NanoMill

 

Ion MIll

1   East Fishkill, New York
4499
Edwards  

Edwards  

S150 

List all items of this typeSample Coaters

in Sample Preparation

EDWARDS CARBON EVAPORATION SOURCE:
Carbon Evaporation Source
1   F* Scotia, New York
181557
FEI  

FEI  

200XP TMP 

List all items of this typeFocused Ion Beam Tools

in Ion Beam Equipment

FEI FOCUSED ION BEAM SYSTEM:
Focus Ion Beam System

The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
1   F* Scotia, New York
202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

1   Singapore
203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

1   Malta, New York
203115
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

Connected Idle.

 

1   Malta, New York
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

1   East Fishkill, New York
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


1   Taichung, Taichung City
202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 

1   Singapore
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

1   East Fishkill, New York
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

1   East Fishkill, New York
199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

FEI, EXPIDA, Dual Beam FIB, 300mm :

FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


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1   F* Dresden, Saxony
203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

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1   Malta, New York
202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

1   Singapore
202837
FEI  

FEI  

Strata FIB 205 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation

 

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1   Singapore
203118
FEI  

FEI  

TEM LINK 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Link:

FEI, TEM Link

1   F* Malta, New York
203120
FEI  

FEI  

Technia G2 F20 TEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

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1   Malta, New York
203121
FEI  

FEI  

Tecnai G2 F20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational

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1   Malta, New York
205917
FEI  

FEI  

V600 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, V600, 4022 262 70111, Single Beam FIB, :

FEI, V600, 4022 262 70111, Single Beam FIB, 

 

In Lab.  Idle

1   N* East Fishkill, New York
134541
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

FIBER OPTIC LIGHT SOURCE:
Remote Fiber Optic Illuminator

Model FOI-150-Remote
1 180.00 F* Scotia, New York
134624
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

FIBER OPTIC LIGHT SOURCE:
Fiber Optic Illuminator

Manufacturer Unknown
1 180.00 F* Scotia, New York
176740
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS).

Includes Gatan Binocular Microscope

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

1   F* Scotia, New York
175315
Gatan  

Gatan  

681 

List all items of this typeSample Coaters

in Sample Preparation

GATAN ION BEAM COATER (IBC):
Ion Beam Coater

Ion Beam Coater (IBC) designed to produce high-quality conductive coatings on

SEM or TEM specimens
1   F* Scotia, New York
202146
Hitachi  

Hitachi  

HF-2000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging

200KeV Advanced Analytical TEM  

1995 Vintage

S/N : 6214-3

Un-hooked in lab.

1   East Fishkill, New York
100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
1   F* Scotia, NY
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
1   F* Scotia, NY
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Hitachi S-7000:
CD SEM Measurement Tool
1   F* Plano, TX
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
1   F* Scotia, NY
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
1   F* Taichung, Taichung City
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




1   F* Singapore
205915
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

Hitachi, S-5200 SEM, :

Hitachi, S-5200 SEM, 

 

In the lab.  Idle.

1   N* East Fishkill, New York
205916
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

Hitachi, S-5200 SEM, :

Hitachi, S-5200 SEM, 

 

In the lab.  Idle.

1   N* East Fishkill, New York
203281
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

Hitachi, S-5200, SEM, Ultra High Resolution:

Hitachi, S-5200, SEM, Ultra High Resolution

 

 

1   East Fishkill, New York
192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

Hitachi, S-5500- Schanning Electron Microscope, 300mm:

Hitachi, S-5500- Schanning Electron Microscope, 300mm


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1   F* Malta, New York
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