|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
247845
|
KLA-Tencor
|
KLA-Tencor |
Auto RS-55tc |
in Resistivity Testers
KLA-Tencor Auto RS-55tc Resistivity Test Tool:KLA-TENCOR Auto RS-55tc Resistivity Mapping System - Accommodates all Wafer Sizes from 50mm – 200mm
- 5 Megaohm/sq Measurement Range
- Typical Measurement Time: 5 – 4.5 Seconds per Test Site
- <0.2% (1 sigma) Measurement Repeatability
- Thermal Chuck Temperature Measurement Accuracy: ±0.5ºC
- PC Based System Controller
- 25 MHz 486 Based MPU
- 44 MB Removable Hard Disk
- 110 MB Fixed Hard Disk Drive
- 5” Floppy Disk Drive
- X-Y Map: Up to 1200 Sites Programmable
- Probe Qualification: 20 sites
- 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
|
1
|
|
80,021.44 |
|
Austin, Texas |
|
|
129073
|
KLA-Tencor
|
KLA-Tencor |
760-660139-00 |
in Other Motors
KLA-Tencor Power Changing Assy 760-660139-00:3 Lens Power Changing Assy complete w/optics
|
1
|
|
|
|
Plano, TX |
|
|
250822
|
KLA-Tencor
|
KLA-Tencor |
SWE Kit |
in Film Thickness Testers
KLA-TENCOR Spectra fx SWE Kit:KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit
|
1
|
|
|
|
Plano, Texas |
|
|
249589
|
KLA-Tencor
|
KLA-Tencor |
ASET-F5x |
in Film Thickness Testers
KLA-Tencor ASET-F5x UV Film Thickness Monitor:KLA-Tencor ASET-F5x UV Film Thickness Monitor
|
1
|
|
|
|
Plano, Texas |
|
|
250811
|
KLA-Tencor
|
KLA-Tencor |
Aleris 8350 |
in Film Thickness Testers
|
1
|
|
|
|
Plano, Texas |
|
|
250812
|
KLA-Tencor
|
KLA-Tencor |
HRP-240 |
in Film Thickness Testers
KLA-TENCOR HRP-240 High Resolution Profiler:KLA-TENCOR HRP-240 High Resolution Profiler
|
1
|
|
|
|
Plano, Texas |
|
|
247843
|
KLA-Tencor
|
KLA-Tencor |
UV-1050 |
in Film Thickness Testers
KLA-Tencor UV-1050 Thin Film Measurement Tool:KLA-Tencor UV-1050 Thin Film Measurement Tool - Cassette to Cassette Wafer Handling
- Wafer sizes: 100mm, 150mm & 200mm
- Broadband UV Optics
- Dual Beam Spectrophotometry
- Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
- System Control PC with Windows NT OS
- Summit Application Software
- GEM / SECS Communication
- System Installation at Destination Available
|
1
|
|
55,014.74 |
|
Austin, Texas |
|
|
133789
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
740-212542-000 |
in Lamps
KLA-Tencor 740-212542-000 Insert Assy with Lamps:KLA-Tencor 740-212542-000 Insert Assy with LampsInsert Assy with Lamps
|
1
|
|
|
|
Plano, TX |
|
|
250823
|
KLA-Tencor
|
KLA-Tencor |
Viper 2401 |
in Metrology Equipment
KLA-TENCOR Viper 2401 After Develop Inspection Tool:KLA-TENCOR Viper 2401 After Develop Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
|
250821
|
KLA-Tencor
|
KLA-Tencor |
Archer 200 AIM |
in Critical Dimension Measurement Equipment
KLA-TENCOR Archer 200 AIM Overlay Metrology Tool:KLA-TENCOR Archer 200 AIM Overlay Metrology Tool - ETAL Stage
- Yaskawa Robot with NXC100 Controller
- IDE Maxon 1000 Floatation Controller
|
1
|
|
|
|
Plano, Texas |
|
|
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
|
5310
|
KLA-Tencor
|
KLA-Tencor |
7700 |
in Surface Inspection
KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER:Patterned Wafer Contamination Analyzer
- Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
- Capable of measuring defects on unpatterned wafers
- Capable of measuring wafers from 4” to 8”
- High sensitivity on after-etch and high topography applications
- Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
|
1
|
|
|
F* |
Scotia, New York |
|
|
149499
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658164-20 |
in Electrical and Electronic Components
KLA Tencor 710-658164-20 PLLAD-8 Assy:KLA Tencor 710-658164-20 PLLAD-8 AssyPLLAD-8 Assy
|
1
|
|
|
|
Plano, TX |
|
|
149500
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-653016-20 |
in Electrical and Electronic Components
KLA Tencor 710-653016-20 81B Assy:KLA Tencor 710-653016-20 81B Assy81B Assy
|
1
|
|
|
|
Plano, TX |
|
|
149501
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658076-20 |
in Electrical and Electronic Components
KLA Tencor 710-658076-20 Phase 3 Defect Processor PCB:KLA Tencor 710-658076-20 Phase 3 Defect Processor PCBPhase 3 Defect Processor PCB
|
1
|
|
|
|
Plano, TX |
|
|
149503
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658081-20 |
in Electrical and Electronic Components
KLA Tencor 710-658081-20 Defect Filter PCB Assy:KLA Tencor 710-658081-20 Defect Filter PCB AssyDefect Filter PCB Assy
|
1
|
|
|
|
Plano, TX |
|
|
104306
|
KLA-Tencor
|
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
KLA-Tencor AlphaStep 300 Profilometer:Profilometer
|
1
|
|
|
|
Plano, TX |
|
|
251077
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Electron Microscopy
|
1
|
|
|
|
Singapore |
|
|
251078
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Electron Microscopy
|
1
|
|
|
|
Singapore |
|
|
251079
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Electron Microscopy
|
1
|
|
|
|
Singapore |
|
|
251080
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Electron Microscopy
|
1
|
|
|
|
Singapore |
|
|
251617
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Electron Microscopy
|
1
|
|
|
|
Singapore |
|
|
155840
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
410918 |
in Semiconductor Parts
KLA-Tencor PN 410918:L-Stylus, DurasharpL-Stylus, Durasharp
|
5
|
|
|
|
Plano, TX |
|
|
249590
|
KLA-Tencor
|
KLA-Tencor |
Flexus 5400 |
in Metrology Equipment
KLA-Tencor Flexus 5400 Stress Measurement Tool:KLA-Tencor Flexus 5400 Stress Measurement Tool
|
1
|
|
|
|
Plano, Texas |
|
|
250814
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool:KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
|
250815
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too:KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
|
250816
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP3 |
in Surface Inspection
KLA-TENCOR Surfscan SP3 Unpatterned Surface Defect Tool:KLA-TENCOR Surfscan SP3 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
|
250818
|
KLA-Tencor
|
KLA-Tencor |
Puma 9120 |
in Surface Inspection
KLA-TENCOR Puma 9120 Darkfield Inspection Tool:KLA-TENCOR Puma 9120 Darkfield Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
|
250819
|
KLA-Tencor
|
KLA-Tencor |
Puma 9130 |
in Surface Inspection
KLA-TENCOR Puma 9130 Darkfield Inspection Tool:KLA-TENCOR Puma 9130 Darkfield Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
|
50017
|
KLA-Tencor
|
KLA-Tencor |
Surfscan 4500 |
in Surface Inspection
Tencor Surfscan 4500:TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool - Cassette to Cassette Handling of 3” – 6” Wafers
- New HeNe 2mW Laser, 632.8 nm Wavelength
- New HeNe Laser Power Supply
- 2 µ Particle Size Sensitivity
- Automatic Calibration
- Flatscreen Monitor
- System Calibrated & Demonstrated
- Calibration Standard Wafer Included
|
1
|
|
45,012.06 |
|
Plano, Texas |
|
|
252339
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Optical Microscopes
|
1
|
|
|
|
Singapore |
|
|
252340
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Optical Microscopes
|
1
|
|
|
|
Singapore |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Optical Microscopes
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
|
|
Malta, New York |
|
|
126787
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor SQ. 4" Wafer Locator Ring for Flexus 2320:SQ. 4" Wafer Locator Ring for Flexus 2320
|
1
|
|
|
|
Plano, TX |
|
|
126788
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor 3" Wafer Locator Rings for Flexus 2320:3" Wafer Locator Rings for Flexus 2320
|
2
|
|
|
|
Plano, TX |
|