About Us Contact Us Terms & Conditions
Serving  Our Guest Log in    Register to bid, list, and tradeHow to post your own listings   View prices in  or ...    
ALL CATEGORIES   Metrology Eq   Wafer Inspection   Microscope Inspect   Microscopes   Electron Microscopy    View    Search-by-Specs    Input    Edit    

FULL DESCRIPTION of Item 178294

in Scanning Electron Microscopes
Deal directly with Owner:  GLOBALFOUNDRIES USED EQUIPMENT of Santa Clara, California
 
Item ID: 178294

Offered 1 Offered at Best Price


Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm

Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




Tool ID: J-J02

Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm

Location: Singapore
Unit Price Unstated
Number of Units 1
Manufacturer Hitachi
Model AS5000
Extended Description  Details at Configuration J-J02.pdf

OFFERED BY: (click name below to visit its website directly)

GLOBALFOUNDRIES USED EQUIPMENT
Finance
Santa Clara , California
+1.408.462.4875
 


Deal directly with Owner:  GLOBALFOUNDRIES USED EQUIPMENT of Santa Clara, California