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Surface Inspection


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List all 2 product types under Surface InspectionList all 2 product types under Surface Inspection


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
163973
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1 77,801.11 F* Regensburg, Bavaria
AMAT COMPASS PRO 300mm:

Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL

163974
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1 77,801.11 F* Regensburg, Bavaria
AMAT COMPASS PRO 300mm:

Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL

49926
GCA/Tropel  

GCA/Tropel  

9000 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

1   Plano, TX
GCA/TROPEL 9000:
Surface Flatness Analyzer
101271
KLA-Tencor  

KLA-Tencor  

AIT 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   Plano, TX
KLA-Tencor AIT:
Patterned Wafer Defect Inspection Tool with Auto Focus
77963
KLA-Tencor  

KLA-Tencor  

FT-750 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Plano, TX
KLA-Tencor FT-750:
Film Thickness Mapping Tool
5310
KLA-Tencor  

KLA-Tencor  

7700 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Scotia, NY
KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER:
Patterned Wafer Contamination Analyzer

  • Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
  • Capable of measuring defects on unpatterned wafers
  • Capable of measuring wafers from 4” to 8”
  • High sensitivity on after-etch and high topography applications
  • Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
  • 50017
    KLA-Tencor  

    KLA-Tencor  

    Surfscan 4000 

    List all items of this typeUnpatterned Wafer Inspection

    in Surface Inspection

    1   Plano, TX
    Tencor Surfscan 4000 - PARTS TOOL ONLY:
    Wafer Surface Analysis - Parts Tool Only


    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

    NOTE:
       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Surface Inspection:
    Applied Materials, Inc., GCA/Tropel, KLA-Tencor