About Us Contact Us Terms & Conditions
Serving  Our Guest Log in    Register to bid, list, and tradeHow to post your own listings   View prices in  or ...    
ALL CATEGORIES   Metrology Eq   Wafer Inspection   Microscope Inspect   Microscopes   View   Search-by-Specs    Input    Edit    
View All Offers Under

Electron Microscopy


» Switch Major Category
Click an item's ID# below for its full specifications and source, or:

Group Offers into sub-categories under Electron MicroscopyGroup Offers into sub-categories under Electron Microscopy

List all 3 product types under Electron MicroscopyList all 3 product types under Electron Microscopy


  • To sort on a column, click the column head; click it again to reverse the sort.
  • Click the links under the Product Type column head to see other like items of that type.
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
181557
FEI  

FEI  

200XP TMP 

List all items of this typeFocused Ion Beam Tools

in Ion Beam Equipment

1   F* Scotia, New York
FEI FOCUSED ION BEAM SYSTEM:
Focus Ion Beam System

The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
6402
JEOL  

JEOL  

JSM 6100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Scotia, NY
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Microscope with LaB Filament
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Singapore
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Singapore
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Singapore
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
81042
Microspec  

Microspec  

WDX-2A(Spectrometer) 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Scotia, NY
MICROSPEC WDX-2A SPECTROMETER:
Spectrometer
201129
Applied Materials  

Applied Materials  

SemvisionG3 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Dresden, Saxony
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

S/N : W-5002

201155
Applied Materials In  

Applied Materials In  

SEMVision G3 Lite 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   Dresden, Saxony
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

S/N : W-3002

Warm idle, in the Fab.

199706
Zeiss  

Zeiss  

Ultra 55, LEO Gemini 

List all items of this typeScanning Electron Microscopes

in Electron Microscopy

1   F* Dresden, Saxony
Zeiss, Ultra 55, LEO Gemini, 300mm, SEM:
Zeiss, Ultra 55, LEO Gemini, 300mm, SEM



*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Electron Microscopy:
Applied Materials Inc., Applied Materials, Inc., CPS, FEI, Hitachi, JEOL, KLA-Tencor, Microspec, Zeiss