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Film Thickness Testers


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List all 12 product types under Film Thickness TestersList all 12 product types under Film Thickness Testers


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
110263
ADE  

ADE  

Episcan 1000 

List all items of this typeFT-IR Spectrometers

in Spectrometers

ADE Episcan 1000:

ADE Episcan 1000 Film Thickness Measurement & Mapping Tool

  • Measurement of Epi Films <25µ
  • ON-LINE TECHNOLOGIES 2110 Spectrometer Head
  • IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler
  • ADE ACS Controller
  • Windows NT Operating System
  • Price.............................................................................$75,000.00
  • As-Is Price....................................................................$40,000.00
1   F* Plano, Texas
225795
Bio-Rad  

Bio-Rad  

QS-1200 

List all items of this typeFT-IR Spectrometers

in Spectrometers

Bio-Rad QS-1200 FT-IR Spectrometer:

BIORAD QS-1200 Automated FT-IR Spectrometer

  • Non-Destructive Measurement of Epitaxial Silicon Films
  • PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage
    • Manual Loading for up to 300mm Wafers
    • 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping
  • FTS-175 Optical Bench
    • Dynamically Tuned Beam Splitter
    • NKBr Beam Splitter
    • Dual Frequency IR Source
    • Upgraded HeNe Laser
  • System Control PC with Windows XP, 320G HD & 1G RAM
    • Win-IR Pro (Rev. 2.51) Application Software
    • QS-500 Epi (Rev. 1.31) Application Software
    • Microsoft Access Database Application
  • System Software, Applications Software & Site Preparation Manuals Included
  • Refurbished & Fully Functional
1 110,029.48 Plano, Texas
144802
CR Technology  

CR Technology  

UF160/0 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

CR Technology XRay System UF160/0:
XRAY Wafer Analyzer
1   Plano, TX
45435
Gaertner  

Gaertner  

L116B 

List all items of this typeEllipsometers

in Film Thickness Testers

GAERTNER ELLIPSOMETER:

Ellipsometer

Upgraded in 2004 by Gaertner

1   F* Scotia, New York
39958
Gaertner  

Gaertner  

L2W16E.1550 

List all items of this typeEllipsometers

in Film Thickness Testers

GAERTNER ELLIPSOMETER 150 MM:

Ellipsometer

1   Scotia, New York
249592
J. A. Woollam  

J. A. Woollam  

M-2000 

List all items of this typeEllipsometers

in Film Thickness Testers

J.A. Woollam M-2000 Spectroscopic Ellipsometer:

J.A. Woollam M-2000 Spectroscopic Ellipsometer

1   Plano, Texas
249729
J.A. Woollam VB-200 Spectroscopic Ellipsometer 
J.A. Woollam VB-200 Spectroscopic Ellipsometer 

List all items of this typeEllipsometers

in Film Thickness Testers

J.A. Woollam VB-200 Spectroscopic Ellipsometer:

J.A. Woollam VB-200 Spectroscopic Ellipsometer

1   Plano, Texas
250811
KLA-Tencor  

KLA-Tencor  

Aleris 8350 

List all items of this typeFilm Thickness Testers - Other

in Film Thickness Testers

1   Plano, Texas
104306
KLA-Tencor  

KLA-Tencor  

AlphaStep 300 

List all items of this typeProfilometers

in Film Thickness Testers

KLA-Tencor AlphaStep 300 Profilometer:
Profilometer
1   Plano, TX
249589
KLA-Tencor  

KLA-Tencor  

ASET-F5x 

List all items of this typeFilm Thickness Testers - Other

in Film Thickness Testers

KLA-Tencor ASET-F5x UV Film Thickness Monitor:

KLA-Tencor ASET-F5x UV Film Thickness Monitor

1   Plano, Texas
250812
KLA-Tencor  

KLA-Tencor  

HRP-240 

List all items of this typeFilm Thickness Testers - Other

in Film Thickness Testers

KLA-TENCOR HRP-240 High Resolution Profiler:

KLA-TENCOR HRP-240 High Resolution Profiler

1   Plano, Texas
250822
KLA-Tencor  

KLA-Tencor  

SWE Kit 

List all items of this typeEllipsometers

in Film Thickness Testers

KLA-TENCOR Spectra fx SWE Kit:

KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit

1   Plano, Texas
247843
KLA-Tencor  

KLA-Tencor  

UV-1050 

List all items of this typeFilm Thickness Testers - Other

in Film Thickness Testers

KLA-Tencor UV-1050 Thin Film Measurement Tool:

KLA-Tencor UV-1050 Thin Film Measurement Tool

  • Cassette to Cassette Wafer Handling
  • Wafer sizes: 100mm, 150mm & 200mm
  • Broadband UV Optics
  • Dual Beam Spectrophotometry
  • Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
  • System Control PC with Windows NT OS
  • Summit Application Software
  • GEM / SECS Communication
  • System Installation at Destination Available
1 55,014.74 Austin, Texas
58429
McPherson  

McPherson  

2035 

List all items of this typeUV-Visible Spectrophotometers

in Spectrophotometers

MCPHERSON 2035 SPECTROMETER:

UV-VIS-IR Spectrophotometer

1   F* Scotia, New York
248941
Nanometrics  

Nanometrics  

8300XSE 

List all items of this typeEllipsometers

in Film Thickness Testers

Nanometrics 8300XSE Film Thickness Analyzer:

Nanometrics 8300XSE Film Thickness Analyzer

  • J.A. Woollam M-44 Spectroscopic Ellipsometer
  • J.A. Woollam EC-270 Ellipsometer Controller
  • J.A. Woollam LPS-420 Xenon Light Source
  • Manual Loading of up to 300mm Wafers
  • Yaskawa ERCR-NS01-B004 Motion Controller
1   Plano, Texas
42358
Nicolet  

Nicolet  

NEXUS 470 

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in Spectrometers

NICOLET (THERMO) FT-IR SPECTROMETER :

FT-IR with Spectra-Tech Continuum Scope and TGA Interface

Nicolet NEXUS 470

Nicolet acquired by Thermo Scientific

 

1   F* Scotia, New York
159451
Nicolet  

Nicolet  

Magna-IR 550 

List all items of this typeFT-IR Spectrometers

in Spectrometers

NICOLET Magna-IR 550:
FT-IR Spectrometer
1   F* Plano, TX
172746
Plasmos  

Plasmos  

SD 2004 

List all items of this typeEllipsometers

in Film Thickness Testers

Plasmos SD-2004 Multi-Wavelength Ellipsometer:
Plasmos SD-2004 Multi-Wavelength Ellipsometer
1   Plano, TX
179535
Plasmos  

Plasmos  

SD2000 

List all items of this typeEllipsometers

in Film Thickness Testers

1   Plano, TX
103332
Rigaku  

Rigaku  

TXRF 300S 

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in Spectrometers

RIGAKU X-RAY FLUORESENCE SPECTROMETER:

X-Ray Fluoresence Spectrometer
Model: TXRF 300S

1   F* Scotia, New York
58212
Rudolph Research  

Rudolph Research  

AUTO EL RE-350 

List all items of this typeEllipsometers

in Film Thickness Testers

RUDOLPH RESEARCH ELLIPSOMETER 150MM:

Ellipsometer

1   Scotia, New York
86164
Rudolph Technologies  

Rudolph Technologies  

AUTO EL 

List all items of this typeEllipsometers

in Film Thickness Testers

RUDOLPH RESEARCH ELLIPSOMETER 150MM:

Ellipsometer

1   F* Scotia, New York
50006
Sagax  

Sagax  

Isoscope 125 

List all items of this typeEllipsometers

in Film Thickness Testers

Sagax Isoscope 125:
Ellipsometer
1   Plano, TX
241435
Sloan  

Sloan  

Dektak 3ST Auto 1 

List all items of this typeProfilometers

in Film Thickness Testers

Sloan Dektak3ST Surface Profile Measuring System:

Sloan Dektak3ST Auto 1 Surface Profile Measuring System

  • For Step Height & Surface Texture Measurement
  • Self-Contained, Small Footprint Design
  • Joystick Controlled Scanning Stage 
  • 8000 Data Points
  • Specimen Stage: 6.5”(dia.); 6”X Axis X 3”Y Axis Travel; 360° θ
  • Maximum Sample Thickness: 1.5”
  • Measurement Display Range: 100Å to 1,310KÅ
  • Vertical Resolution: 1Å/65KÅ; 10Å/655KÅ; 20Å/1310KÅ
  • Stylus Force Range: 1mg to 40mg
  • Scan Length Range: 50m to 50mm
  • Scan Time Range: 3 to 50 Seconds
  • Video Zoom Range: 60X to 420X (Motorized)
1   Plano, Texas
136700
Spectronic Unicam  

Spectronic Unicam  

4001/4 

List all items of this typeSpectrometers - Other

in Spectrometers

SPECTRONIC UNICAM SPECTROPHOTOMETER Genesys 20 4001/4:

Spectrophotometer

Genesys 20 Visible Spectrometer Spectronic Unicam 4001/4

1   Scotia, New York
140974
Thermo Electron  

Thermo Electron  

MicroXR GXR/C 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

THERMO ELECTRON MICROBEAM X-RAY FLUORESCENCE XRF SYSTEM:

X-Ray Fluorescence System

Thermo Scientific MicroXR GXR/C

2   Scotia, New York
98184
Veeco  

Veeco  

Dektak 3030 Auto II 

List all items of this typeProfilometers

in Film Thickness Testers

VEECO PROFILOMETER:

Profilometer

1   F* Scotia, New York
109557
Veeco  

Veeco  

Dektak 3030 

List all items of this typeProfilometers

in Film Thickness Testers

VEECO PROFILOMETER:

Profilometer

1   F* Scotia, New York


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Film Thickness Testers:
ADE, Bio-Rad, CR Technology, Gaertner, J. A. Woollam, KLA-Tencor, McPherson, Nanometrics, Nicolet, Plasmos, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Sloan, Spectronic Unicam, Thermo Electron, Veeco Instruments