|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
110263
|
ADE
|
ADE |
Episcan 1000 |
in Spectrometers
ADE Episcan 1000:ADE Episcan 1000 Film Thickness Measurement & Mapping Tool - Measurement of Epi Films <25µ
- ON-LINE TECHNOLOGIES 2110 Spectrometer Head
- IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler
- ADE ACS Controller
- Windows NT Operating System
- Price.............................................................................$75,000.00
- As-Is Price....................................................................$40,000.00
|
1
|
|
|
F* |
Plano, Texas |
|
|
225795
|
Bio-Rad
|
Bio-Rad |
QS-1200 |
in Spectrometers
Bio-Rad QS-1200 FT-IR Spectrometer:BIORAD QS-1200 Automated FT-IR Spectrometer - Non-Destructive Measurement of Epitaxial Silicon Films
- PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage
- Manual Loading for up to 300mm Wafers
- 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping
- FTS-175 Optical Bench
- Dynamically Tuned Beam Splitter
- NKBr Beam Splitter
- Dual Frequency IR Source
- Upgraded HeNe Laser
- System Control PC with Windows XP, 320G HD & 1G RAM
- Win-IR Pro (Rev. 2.51) Application Software
- QS-500 Epi (Rev. 1.31) Application Software
- Microsoft Access Database Application
- System Software, Applications Software & Site Preparation Manuals Included
- Refurbished & Fully Functional
|
1
|
|
110,029.48 |
|
Plano, Texas |
|
|
144802
|
CR Technology
|
CR Technology |
UF160/0 |
in Spectrometers
CR Technology XRay System UF160/0:XRAY Wafer Analyzer
|
1
|
|
|
|
Plano, TX |
|
|
45435
|
Gaertner
|
Gaertner |
L116B |
in Film Thickness Testers
GAERTNER ELLIPSOMETER:Ellipsometer Upgraded in 2004 by Gaertner
|
1
|
|
|
F* |
Scotia, New York |
|
|
39958
|
Gaertner
|
Gaertner |
L2W16E.1550 |
in Film Thickness Testers
GAERTNER ELLIPSOMETER 150 MM:Ellipsometer
|
1
|
|
|
|
Scotia, New York |
|
|
249592
|
J. A. Woollam
|
J. A. Woollam |
M-2000 |
in Film Thickness Testers
J.A. Woollam M-2000 Spectroscopic Ellipsometer:J.A. Woollam M-2000 Spectroscopic Ellipsometer
|
1
|
|
|
|
Plano, Texas |
|
|
249729
|
J.A. Woollam VB-200 Spectroscopic Ellipsometer
|
J.A. Woollam VB-200 Spectroscopic Ellipsometer |
in Film Thickness Testers
J.A. Woollam VB-200 Spectroscopic Ellipsometer:J.A. Woollam VB-200 Spectroscopic Ellipsometer
|
1
|
|
|
|
Plano, Texas |
|
|
250811
|
KLA-Tencor
|
KLA-Tencor |
Aleris 8350 |
in Film Thickness Testers
|
1
|
|
|
|
Plano, Texas |
|
|
104306
|
KLA-Tencor
|
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
KLA-Tencor AlphaStep 300 Profilometer:Profilometer
|
1
|
|
|
|
Plano, TX |
|
|
249589
|
KLA-Tencor
|
KLA-Tencor |
ASET-F5x |
in Film Thickness Testers
KLA-Tencor ASET-F5x UV Film Thickness Monitor:KLA-Tencor ASET-F5x UV Film Thickness Monitor
|
1
|
|
|
|
Plano, Texas |
|
|
250812
|
KLA-Tencor
|
KLA-Tencor |
HRP-240 |
in Film Thickness Testers
KLA-TENCOR HRP-240 High Resolution Profiler:KLA-TENCOR HRP-240 High Resolution Profiler
|
1
|
|
|
|
Plano, Texas |
|
|
250822
|
KLA-Tencor
|
KLA-Tencor |
SWE Kit |
in Film Thickness Testers
KLA-TENCOR Spectra fx SWE Kit:KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit
|
1
|
|
|
|
Plano, Texas |
|
|
247843
|
KLA-Tencor
|
KLA-Tencor |
UV-1050 |
in Film Thickness Testers
KLA-Tencor UV-1050 Thin Film Measurement Tool:KLA-Tencor UV-1050 Thin Film Measurement Tool - Cassette to Cassette Wafer Handling
- Wafer sizes: 100mm, 150mm & 200mm
- Broadband UV Optics
- Dual Beam Spectrophotometry
- Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
- System Control PC with Windows NT OS
- Summit Application Software
- GEM / SECS Communication
- System Installation at Destination Available
|
1
|
|
55,014.74 |
|
Austin, Texas |
|
|
58429
|
McPherson
|
McPherson |
2035 |
in Spectrophotometers
MCPHERSON 2035 SPECTROMETER:UV-VIS-IR Spectrophotometer
|
1
|
|
|
F* |
Scotia, New York |
|
|
248941
|
Nanometrics
|
Nanometrics |
8300XSE |
in Film Thickness Testers
Nanometrics 8300XSE Film Thickness Analyzer:Nanometrics 8300XSE Film Thickness Analyzer - J.A. Woollam M-44 Spectroscopic Ellipsometer
- J.A. Woollam EC-270 Ellipsometer Controller
- J.A. Woollam LPS-420 Xenon Light Source
- Manual Loading of up to 300mm Wafers
- Yaskawa ERCR-NS01-B004 Motion Controller
|
1
|
|
|
|
Plano, Texas |
|
|
42358
|
Nicolet
|
Nicolet |
NEXUS 470 |
in Spectrometers
NICOLET (THERMO) FT-IR SPECTROMETER :FT-IR with Spectra-Tech Continuum Scope and TGA Interface
Nicolet NEXUS 470 Nicolet acquired by Thermo Scientific
|
1
|
|
|
F* |
Scotia, New York |
|
|
159451
|
Nicolet
|
Nicolet |
Magna-IR 550 |
in Spectrometers
NICOLET Magna-IR 550:FT-IR Spectrometer
|
1
|
|
|
F* |
Plano, TX |
|
|
172746
|
Plasmos
|
Plasmos |
SD 2004 |
in Film Thickness Testers
Plasmos SD-2004 Multi-Wavelength Ellipsometer:Plasmos SD-2004 Multi-Wavelength Ellipsometer
|
1
|
|
|
|
Plano, TX |
|
|
179535
|
Plasmos
|
Plasmos |
SD2000 |
in Film Thickness Testers
|
1
|
|
|
|
Plano, TX |
|
|
103332
|
Rigaku
|
Rigaku |
TXRF 300S |
in Spectrometers
RIGAKU X-RAY FLUORESENCE SPECTROMETER:X-Ray Fluoresence Spectrometer Model: TXRF 300S
|
1
|
|
|
F* |
Scotia, New York |
|
|
58212
|
Rudolph Research
|
Rudolph Research |
AUTO EL RE-350 |
in Film Thickness Testers
RUDOLPH RESEARCH ELLIPSOMETER 150MM:Ellipsometer
|
1
|
|
|
|
Scotia, New York |
|
|
86164
|
Rudolph Technologies
|
Rudolph Technologies |
AUTO EL |
in Film Thickness Testers
RUDOLPH RESEARCH ELLIPSOMETER 150MM:Ellipsometer
|
1
|
|
|
F* |
Scotia, New York |
|
|
50006
|
Sagax
|
Sagax |
Isoscope 125 |
in Film Thickness Testers
Sagax Isoscope 125:Ellipsometer
|
1
|
|
|
|
Plano, TX |
|
|
241435
|
Sloan
|
Sloan |
Dektak 3ST Auto 1 |
in Film Thickness Testers
Sloan Dektak3ST Surface Profile Measuring System:Sloan Dektak3ST Auto 1 Surface Profile Measuring System - For Step Height & Surface Texture Measurement
- Self-Contained, Small Footprint Design
- Joystick Controlled Scanning Stage
- 8000 Data Points
- Specimen Stage: 6.5”(dia.); 6”X Axis X 3”Y Axis Travel; 360° θ
- Maximum Sample Thickness: 1.5”
- Measurement Display Range: 100Å to 1,310KÅ
- Vertical Resolution: 1Å/65KÅ; 10Å/655KÅ; 20Å/1310KÅ
- Stylus Force Range: 1mg to 40mg
- Scan Length Range: 50m to 50mm
- Scan Time Range: 3 to 50 Seconds
- Video Zoom Range: 60X to 420X (Motorized)
|
1
|
|
|
|
Plano, Texas |
|
|
136700
|
Spectronic Unicam
|
Spectronic Unicam |
4001/4 |
in Spectrometers
SPECTRONIC UNICAM SPECTROPHOTOMETER Genesys 20 4001/4:Spectrophotometer Genesys 20 Visible Spectrometer Spectronic Unicam 4001/4
|
1
|
|
|
|
Scotia, New York |
|
|
140974
|
Thermo Electron
|
Thermo Electron |
MicroXR GXR/C |
in Spectrometers
THERMO ELECTRON MICROBEAM X-RAY FLUORESCENCE XRF SYSTEM:X-Ray Fluorescence System
Thermo Scientific MicroXR GXR/C
|
2
|
|
|
|
Scotia, New York |
|
|
98184
|
Veeco
|
Veeco |
Dektak 3030 Auto II |
in Film Thickness Testers
VEECO PROFILOMETER:Profilometer
|
1
|
|
|
F* |
Scotia, New York |
|
|
109557
|
Veeco
|
Veeco |
Dektak 3030 |
in Film Thickness Testers
VEECO PROFILOMETER:Profilometer
|
1
|
|
|
F* |
Scotia, New York |
|