|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
247845
|
KLA-Tencor
|
KLA-Tencor |
Auto RS-55tc |
in Resistivity Testers
KLA-Tencor Auto RS-55tc Resistivity Test Tool:KLA-TENCOR Auto RS-55tc Resistivity Mapping System - Accommodates all Wafer Sizes from 50mm – 200mm
- 5 Megaohm/sq Measurement Range
- Typical Measurement Time: 5 – 4.5 Seconds per Test Site
- <0.2% (1 sigma) Measurement Repeatability
- Thermal Chuck Temperature Measurement Accuracy: ±0.5ºC
- PC Based System Controller
- 25 MHz 486 Based MPU
- 44 MB Removable Hard Disk
- 110 MB Fixed Hard Disk Drive
- 5” Floppy Disk Drive
- X-Y Map: Up to 1200 Sites Programmable
- Probe Qualification: 20 sites
- 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
|
1
|
|
80,021.44 |
|
Austin, Texas |
|
|
247844
|
KLA-Tencor
|
KLA-Tencor |
RS-55tc |
in Resistivity Testers
KLA-Tencor RS-55tc Resistivity Test Tool:KLA-Tencor RS-55tc Resistivity Test Tool - Accommodates all Wafer Sizes from 50mm – 200mm
- Sheet Resistance Measurement of 5 mohm/sq to 5 Mohm/sq
- Typical Measurement Time: 5 – 4.5 Seconds per Test Site
- <0.2% (1 sigma) Measurement Repeatability
- X-Y Map: Programmable Up to 1200 Sites
- Probe Qualification: 20 sites
- 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
- PC Based System Controller with Color Monitor
|
1
|
|
35,009.38 |
|
Austin, Texas |
|
|
245141
|
Hitachi
|
Hitachi |
REM-S 9380-2 |
in Wafer Manufacturing Metrology Equipment
METV34-01 (REM-S 9380-2):Microscope for Critical Dimension
|
1
|
|
|
|
Villach, Carinthia |
|
|
212139
|
Minato
|
Minato |
MM-6600 |
in Wafer Testers
Minato MM-6600 Wafer Mobility Tester:Minato MM-6600 Wafer Mobility Tester - MECS UX-1000 Wafer Handling Robot
- PC Controlled
|
2
|
|
|
|
Plano, Texas |
|
|
212140
|
Minato MM-6600 Wafer Mobility Tester
|
Minato MM-6600 Wafer Mobility Tester |
in Wafer Testers
Minato MM-6600 Wafer Mobility Tester:Minato MM-6600 Wafer Mobility Tester - MECS UX-1000 Wafer Handling Robot
- PC Controlled
|
2
|
|
|
|
Plano, Texas |
|
|
26911
|
Philips
|
Philips |
DCD 120 |
in Wafer Manufacturing Metrology Equipment
PHILIPS DOUBLE CRYSTAL DIFFRACTOMETER:Double Crystal Diffractometer
Double Crystal Diffractometer optimized for fast rocking curve analysis of pseudomorphic epitaxial layer structures.
|
1
|
|
|
F* |
Scotia, New York |
|
|
245221
|
Tencor
|
Tencor |
RS75-01 |
in Wafer Manufacturing Metrology Equipment
RS75-01:wafer sheet resistance measurement system, Tool in production
|
1
|
|
|
|
Villach, Carinthia |
|
|
249014
|
Accretech
|
Accretech |
TSK |
in Wafer Manufacturing Metrology Equipment
TSK Prober UF200/UF200A Bundle :Several TSK Probers are sold in a package. TSK-136 | TSK-050 | TSK-089 | TSK-039 | TSK-117 | TSK-094 | TSK-061 | TSK-120 | TSK-119 | TSK-113 | TSK-008 | TSK-044 | TSK Prober + Hinge | TSK-Prober | TSK-Prober | TSK-Prober | TSK Prober | TSK Prober | TSK Prober + Hinge | TSK-Prober | TSK-Prober | TSK-Prober | TSK-Prober | TSK-Prober | UF200 | UF200 | UF200A Cool | UF200 | UF200A | UF200 | UF200A | UF200A | UF200A | UF200A | UF200 | UF200 |
|
12
|
|
|
N* |
Villach, Carinthia |
|
|
245222
|
Prometrix
|
Prometrix |
UV1080-01 |
in Wafer Manufacturing Metrology Equipment
UV1080-01:KLA-Tencor - Tool in production - Measures Film Thickness, Refractive Index (RI) and Extinction Coefficient of Single and Multi-Layer Thin Film Stacks Simultaneously without Referencing
|
1
|
|
|
|
Villach, Carinthia |
|