Displaying 1-100 of 228 Page 1 2 3 |
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Item ID |
Photo |
Short Description |
Product Type / Details |
#
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Price |
Notes |
Location |
Make |
Model |
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$ |
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110263
|
ADE
|
ADE |
Episcan 1000 |
in Spectrometers
ADE Episcan 1000:ADE Episcan 1000 Film Thickness Measurement & Mapping Tool - Measurement of Epi Films <25µ
- ON-LINE TECHNOLOGIES 2110 Spectrometer Head
- IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler
- ADE ACS Controller
- Windows NT Operating System
- Price.............................................................................$75,000.00
- As-Is Price....................................................................$40,000.00
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1
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F* |
Plano, Texas |
|
|
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Electron Microscopy
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
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1
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N* |
Singapore |
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111048
|
American Optical
|
American Optical |
1177-1 |
in Fiber Optic Illuminators
AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
2
|
|
195.05 |
|
Scotia, New York |
|
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171583
|
Anatech Ltd
|
Anatech Ltd |
Hummer 6.6T |
in Sample Preparation
ANATECH HUMMER 6.6T SPUTTER SYSTEM:Sputter System
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1
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|
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F* |
Scotia, New York |
|
|
204578
|
Orbotech
|
Orbotech |
Ultra Discovery VM |
in Metrology Equipment
AOI Orbotech Ultra Discovery VM:Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits - High throughput and superior detection with minimal number of false calls
- Especially designed for inspection of the finest lines down to 10μm
- Quick set-up even for the most complicated jobs for higher productivity
- Automation ready
- Very high uptime
SIP TechnologyTM Push-to-Scan®: - A ‘no set-up’ process
- Top AOI results with minimal effort or training
- The easiest, user-friendly interface (GUI)
- Full ‘Step and Repeat’ functions
Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: - Full panel understanding, context-based detection engine
- Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
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1
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24,906.67 |
|
Regensburg, Bavaria |
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184614
|
ATM GmbH
|
ATM GmbH |
Brillant BR250.2 |
in Slicing Saws
ATM GmbH CUT OFF SAW 12" :Cut-Off Saw
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1
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F* |
Scotia, New York |
|
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1786
|
Bausch & Lomb
|
Bausch & Lomb |
Type A |
in Parts and Accessories, Microscope
BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:Type A Incident Light Stand
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
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12
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|
185.05 |
|
Scotia, New York |
|
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1785
|
Bausch & Lomb
|
Bausch & Lomb |
312690 |
in Parts and Accessories, Microscope
BAUSCH & LOMB ER-ARM:ER-Arm
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
|
10
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|
180.05 |
F* |
Scotia, New York |
|
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208308
|
Bausch and Lomb
|
Bausch and Lomb |
MicroZoom |
in Optical Microscopes
BAUSCH & LOMB INDUSTRIAL MICROSCOPE INCIDENT LIGHT:Industrial microscope with long working distance objectives.
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1
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F* |
Scotia, New York |
|
|
964
|
Bausch & Lomb
|
Bausch & Lomb |
MicroZoomII |
in Optical Microscopes
BAUSCH & LOMB MICROSCOPE WORK STATION:Microscope Work Station
Long working distance objectives
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1
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|
|
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Scotia, New York |
|
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248
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 7 |
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:Stereo Zoom Microscope with Camera
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1
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|
|
|
Scotia, New York |
|
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3264
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 1 |
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:Stereo Zoom Microscope
Microscopes listed are for pod and eyepieces only
|
13
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|
225.06 |
|
Scotia, New York |
|
|
110365
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 2 |
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 2X:Stereo Zoom Microscope
Microscopes listed are for pod and eyepieces only
|
1
|
|
350.09 |
|
Scotia, New York |
|
|
1800
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 5 |
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:Stereo Zoom Microscope
Scopes listed include pod and eyepieces only
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1
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|
600.16 |
|
Scotia, New York |
|
|
159266
|
Bausch & Lomb
|
Bausch & Lomb |
SZ4 |
in Optical Microscopes
Bausch & Lomb Stereo Zoom 4:StereoZoom 4 Microscope with Boom Stand
|
1
|
|
|
F* |
Plano, TX |
|
|
161016
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 4 |
in Optical Microscopes
Bausch & Lomb StereoZoom 4:Microscope on Small Base
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1
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|
|
|
Plano, TX |
|
|
161018
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 6 Plus |
in Optical Microscopes
Bausch & Lomb StereoZoom 6 Plus:Microscope Head
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1
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|
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F* |
Plano, TX |
|
|
159267
|
Bausch & Lomb
|
Bausch & Lomb |
SZ 6-ST |
in Optical Microscopes
Bausch & Lomb StereoZoom 6-ST:StereoZoom Microscope with Boom Stand
|
1
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|
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|
Plano, TX |
|
|
157435
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 7 |
in Optical Microscopes
BAUSCH & LOMB StereoZoom 7:Microscope & Boom Stand
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1
|
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F* |
Plano, TX |
|
|
110364
|
Bausch & Lomb
|
Bausch & Lomb |
Type K |
in Parts and Accessories, Microscope
BAUSCH & LOMB TYPE K STAND:K Stand for B&L StereoZoom Microscopes
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope E-Arm not included
|
1
|
|
235.06 |
|
Scotia, New York |
|
|
231442
|
Bio-Rad Q7 Overlay Metrology Tool
|
Bio-Rad Q7 Overlay Metrology Tool |
in Metrology Equipment
Bio-Rad Q7 Overlay Metrology Tool:Bio-Rad Q7 Overlay Metrology Tool
|
1
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|
|
|
Plano, Texas |
|
|
219230
|
Bio-Rad
|
Bio-Rad |
Q8 |
in Metrology Equipment
Bio-Rad Q8 Overlay Metrology Tool:Bio-Rad Q8 Overlay Metrology Tool
|
1
|
|
|
|
Plano, Texas |
|
|
225795
|
Bio-Rad
|
Bio-Rad |
QS-1200 |
in Spectrometers
Bio-Rad QS-1200 FT-IR Spectrometer:BIORAD QS-1200 Automated FT-IR Spectrometer - Non-Destructive Measurement of Epitaxial Silicon Films
- PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage
- Manual Loading for up to 300mm Wafers
- 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping
- FTS-175 Optical Bench
- Dynamically Tuned Beam Splitter
- NKBr Beam Splitter
- Dual Frequency IR Source
- Upgraded HeNe Laser
- System Control PC with Windows XP, 320G HD & 1G RAM
- Win-IR Pro (Rev. 2.51) Application Software
- QS-500 Epi (Rev. 1.31) Application Software
- Microsoft Access Database Application
- System Software, Applications Software & Site Preparation Manuals Included
- Refurbished & Fully Functional
|
1
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110,029.48 |
|
Plano, Texas |
|
|
31390
|
Bio-Rad
|
Bio-Rad |
Q5 |
in Critical Dimension Measurement Equipment
BioRad Q5:Overlay Registration Tool - Has Been Upgraded to a Q6CD Measurement, Single and Two-Axis Overlay Registration
|
1
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|
|
F* |
Plano, TX |
|
|
121504
|
Bio-Rad
|
Bio-Rad |
Q5 |
in Critical Dimension Measurement Equipment
Biorad Q5:Overlay Registration Tool
|
2
|
|
|
|
Plano, TX |
|
|
54652
|
Bio-Rad
|
Bio-Rad |
Q7/Q8 |
in Critical Dimension Measurement Equipment
BioRad Q7/Q8 Overlay Metrology Tool:Overlay Metrology Tool for up to 200mm Wafers
|
1
|
|
|
F* |
Plano, TX |
|
|
109598
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Table Clamp Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
4
|
|
300.08 |
|
Scotia, New York |
|
|
109648
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
1
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325.09 |
|
Scotia, New York |
|
|
109553
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
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325.09 |
|
Scotia, New York |
|
|
109554
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
|
325.09 |
|
Scotia, New York |
|
|
109549
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand w/ Rotatable Knuckle
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
|
350.09 |
|
Scotia, New York |
|
|
109122
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
19
|
|
350.09 |
F* |
Scotia, New York |
|
|
109425
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand w/ Rectangular Horizontal Post
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
6
|
|
350.09 |
|
Scotia, New York |
|
|
109427
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Dual Arm Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
|
350.09 |
|
Scotia, New York |
|
|
209828
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
1
|
|
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|
Malta, New York |
|
|
4436
|
Buehler
|
Buehler |
Consumables |
in Sample Preparation
BUEHLER CONSUMABLES, POLISHING AND GRINDING:Polishing and Grinding Consumables
|
4
|
|
|
|
Scotia, NY |
|
|
122523
|
Buehler
|
Buehler |
Dressing Chuck |
in Slicing Saws
BUEHLER ISOMET DRESSING CHUCK:Dressing Chuck
|
2
|
|
185.05 |
F* |
Scotia, New York |
|
|
142877
|
Buehler
|
Buehler |
ISOMET |
in Slicing Saws
BUEHLER LOW SPEED CUT-OFF SAW:Precision Sectioning Saw
Representative photo - color of saw may vary
Various ISOMET chucks available. See other information for more details.
|
2
|
|
3,325.89 |
F* |
Scotia, New York |
|
|
116574
|
Buehler
|
Buehler |
Primet |
in Sample Preparation
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:Modular Dispensing Satellite
|
1
|
|
625.17 |
F* |
Scotia, New York |
|
|
7353
|
CPS
|
CPS |
6004/1958 |
in Electron Microscopy
CPS SEM ELECTRON GUN POWER SUPPLY 30KV:Electron Gun Power Supply
CPS SEM Power Supply 6004
|
1
|
|
3,751.00 |
|
Scotia, New York |
|
|
144802
|
CR Technology
|
CR Technology |
UF160/0 |
in Spectrometers
CR Technology XRay System UF160/0:XRAY Wafer Analyzer
|
1
|
|
|
|
Plano, TX |
|
|
28680
|
Dage-MTI
|
Dage-MTI |
SERIES 68 |
in Optical Microscopes
DAGE-MTI SERIES 68 INFRARED CAMERA:Infrared Camera
|
2
|
|
1,100.29 |
|
Scotia, New York |
|
|
194899
|
DELTRONIC
|
DELTRONIC |
DH14-RR |
in Optical Microscopes
Deltronic DH14-RR Profile Projector :Deltronic DH14-RR Profile Projector
|
1
|
|
|
|
Plano, Texas |
|
|
57426
|
Denton
|
Denton |
DESK II |
in Sample Preparation
DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :Metal Sputter
|
1
|
|
6,251.67 |
F* |
Scotia, New York |
|
|
159268
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
|
in Optical Microscopes
Diagnostic Instruments:Microscope Boom Stand
|
2
|
|
|
|
Plano, TX |
|
|
86452
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
SMS16-B |
in Parts and Accessories, Microscope
DIAGNOSTIC INSTRUMENTS BOOM STAND:Boom Stand
|
1
|
|
325.09 |
F* |
Scotia, New York |
|
|
109548
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
SMS16-A |
in Parts and Accessories, Microscope
DIAGNOSTIC INSTRUMENTS BOOM STAND:Weighted Base Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
|
350.09 |
|
Scotia, New York |
|
|
18711
|
Dolan Jenner
|
Dolan Jenner |
180 |
in Fiber Optic Illuminators
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
1
|
|
150.04 |
F* |
Scotia, New York |
|
|
122729
|
Dolan Jenner
|
Dolan Jenner |
PL-750A- 111 |
in Fiber Optic Illuminators
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
1
|
|
225.06 |
F* |
Scotia, NY |
|
|
230317
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Optical Microscopes
FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:FEI, ExSolve CLM next Gen, 300mm, S/N 9923535
|
1
|
|
|
|
Malta, New York |
|
|
230318
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Optical Microscopes
FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:FEI, ExSolve CLM next Gen, 300mm, S/N 9923609
|
1
|
|
|
|
Malta, New York |
|
|
134541
|
FIBER OPTIC LIGHT SOURCE
|
FIBER OPTIC LIGHT SOURCE |
in Fiber Optic Illuminators
FIBER OPTIC LIGHT SOURCE:Remote Fiber Optic Illuminator
Model FOI-150-Remote
|
1
|
|
180.05 |
|
Scotia, New York |
|
|
134624
|
FIBER OPTIC LIGHT SOURCE
|
FIBER OPTIC LIGHT SOURCE |
in Fiber Optic Illuminators
FIBER OPTIC LIGHT SOURCE:Fiber Optic Illuminator
Manufacturer Unknown
|
1
|
|
180.05 |
|
Scotia, New York |
|
|
238938
|
Four Dimensions
|
Four Dimensions |
CV92A |
in Metrology Equipment
Four Dimensions CV92A Semiautomatic CV Plotter:Four Dimensions CV92A Semiautomatic CV Plotter - Mercury Probe
- System Control Computer
- Embedded Computer
|
1
|
|
50,013.40 |
|
Plano, Texas |
|
|
45435
|
Gaertner
|
Gaertner |
L116B |
in Film Thickness Testers
GAERTNER ELLIPSOMETER:Ellipsometer Upgraded in 2004 by Gaertner
|
1
|
|
|
F* |
Scotia, New York |
|
|
39958
|
Gaertner
|
Gaertner |
L2W16E.1550 |
in Film Thickness Testers
GAERTNER ELLIPSOMETER 150 MM:Ellipsometer
|
1
|
|
|
|
Scotia, New York |
|
|
233897
|
Gatan
|
Gatan |
691 PIPS |
in Sample Preparation
GATAN PRECISION ION POLISHING SYSTEM:Precision Ion Polishing System (PIPS). The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.
|
1
|
|
|
F* |
Scotia, New York |
|
|
49926
|
GCA/Tropel
|
GCA/Tropel |
9000 |
in Surface Inspection
GCA/TROPEL 9000:Surface Flatness Analyzer
|
1
|
|
|
|
Plano, TX |
|
|
248238
|
Hitachi
|
Hitachi |
CG4100 |
in Optical Microscopes
|
1
|
|
|
N* |
East Fishkill, New York |
|
|
35762
|
Hitachi
|
Hitachi |
S-7000 |
in Critical Dimension Measurement Equipment
Hitachi S-7000:CD SEM Measurement Tool
|
1
|
|
|
F* |
Plano, TX |
|
|
237745
|
HMI
|
HMI |
eScan 500 |
in Electron Microscopy
HMI eScan 500, sn: ML07114, Defect Review, 300mm:HMI eScan 500, sn: ML07114, Defect Review, 300mm
|
1
|
|
|
|
Malta, New York |
|
|
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
|
|
Malta, New York |
|
|
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
|
|
Malta, New York |
|
|
332
|
Karl Storz
|
Karl Storz |
483C |
in Parts and Accessories, Microscope
KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE :Twin Fiber Optic Light SourceLight guide not included.
|
1
|
|
350.09 |
|
Scotia, New York |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Optical Microscopes
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
|
|
Malta, New York |
|
|
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
|
104306
|
KLA-Tencor
|
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
KLA-Tencor AlphaStep 300 Profilometer:Profilometer
|
1
|
|
|
|
Plano, TX |
|
|
247845
|
KLA-Tencor
|
KLA-Tencor |
Auto RS-55tc |
in Resistivity Testers
KLA-Tencor Auto RS-55tc Resistivity Test Tool:KLA-TENCOR Auto RS-55tc Resistivity Mapping System - Accommodates all Wafer Sizes from 50mm – 200mm
- 5 Megaohm/sq Measurement Range
- Typical Measurement Time: 5 – 4.5 Seconds per Test Site
- <0.2% (1 sigma) Measurement Repeatability
- Thermal Chuck Temperature Measurement Accuracy: ±0.5ºC
- PC Based System Controller
- 25 MHz 486 Based MPU
- 44 MB Removable Hard Disk
- 110 MB Fixed Hard Disk Drive
- 5” Floppy Disk Drive
- X-Y Map: Up to 1200 Sites Programmable
- Probe Qualification: 20 sites
- 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
|
1
|
|
80,021.44 |
N* |
Austin, Texas |
|
|
5310
|
KLA-Tencor
|
KLA-Tencor |
7700 |
in Surface Inspection
KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER:Patterned Wafer Contamination Analyzer
- Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
- Capable of measuring defects on unpatterned wafers
- Capable of measuring wafers from 4” to 8”
- High sensitivity on after-etch and high topography applications
- Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
|
1
|
|
|
F* |
Scotia, New York |
|
|
247844
|
KLA-Tencor
|
KLA-Tencor |
RS-55tc |
in Resistivity Testers
KLA-Tencor RS-55tc Resistivity Test Tool:KLA-Tencor RS-55tc Resistivity Test Tool - Accommodates all Wafer Sizes from 50mm – 200mm
- Sheet Resistance Measurement of 5 mohm/sq to 5 Mohm/sq
- Typical Measurement Time: 5 – 4.5 Seconds per Test Site
- <0.2% (1 sigma) Measurement Repeatability
- X-Y Map: Programmable Up to 1200 Sites
- Probe Qualification: 20 sites
- 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
- PC Based System Controller with Color Monitor
|
1
|
|
35,009.38 |
N* |
Austin, Texas |
|
|
247843
|
KLA-Tencor
|
KLA-Tencor |
UV-1050 |
in Film Thickness Testers
KLA-Tencor UV-1050 Thin Film Measurement Tool:KLA-Tencor UV-1050 Thin Film Measurement Tool - Cassette to Cassette Wafer Handling
- Wafer sizes: 100mm, 150mm & 200mm
- Broadband UV Optics
- Dual Beam Spectrophotometry
- Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
- System Control PC with Windows NT OS
- Summit Application Software
- GEM / SECS Communication
- System Installation at Destination Included
|
1
|
|
55,014.74 |
N* |
Austin, Texas |
|
|
1127
|
Leco
|
Leco |
VC-50 |
in Slicing Saws
LECO PRECISION DIAMOND CUT OFF SAW 5" BLADE:Vari/Cut Off Saw
|
1
|
|
|
F* |
Scotia, New York |
|
|
18713
|
Fostec
|
Fostec |
8300 |
in Fiber Optic Illuminators
LEEDS FOSTEC FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source Representative photo These units are manufactured by Fostec and re-branded by different companies. The light source received may not be branded Fostec.
|
19
|
|
175.05 |
F* |
Scotia, New York |
|
|
186519
|
Leica
|
Leica |
INM20 |
in Optical Microscopes
LEICA AUTOMATED WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system
|
1
|
|
|
F* |
Scotia, New York |
|
|
1893
|
Leica
|
Leica |
445945 |
in Parts and Accessories, Microscope
LEICA E-ARM FOCUSING DRIVE:Focusing Drive For MS5/MZ6/MZ8
|
9
|
|
|
F* |
Scotia, New York |
|
|
243053
|
Leica
|
Leica |
Polylite 88 |
in Optical Microscopes
LEICA REICHERT BRIGHTFIELD DARKFIELD :Long Working Distance Objectives
|
1
|
|
|
F* |
Scotia, New York |
|
|
165299
|
Leica
|
Leica |
S6 E |
in Optical Microscopes
LEICA STEREO MICROSCOPE 6.3X - 40X:Stereo Microscope with Boom Stand and Ring Light
|
1
|
|
1,550.42 |
F* |
Scotia, New York |
|
|
192026
|
Leica
|
Leica |
S6 E |
in Optical Microscopes
LEICA STEREO MICROSCOPE 6.3X - 40X:Stereo Microscope with Boom Stand, Dual Light Pipes & .75X Aux lens
|
1
|
|
1,725.46 |
F* |
Scotia, New York |
|
|
37954
|
Leica
|
Leica |
INM 100 |
in Optical Microscopes
LEICA WAFER INSPECTION MICROSCOPE, BRIGHT & DARKFIELD:Wafer Inspection Microscope New, never used
|
1
|
|
|
F* |
Scotia, New York |
|
|
169430
|
Leica
|
Leica |
Wild M8 |
in Optical Microscopes
LEICA WILD STEREO MICROSCOPE 6X - 50X:Stereo Microscope
|
1
|
|
|
|
Scotia, New York |
|
|
1643
|
Leica
|
Leica |
POLYLITE88 |
in Optical Microscopes
LEICA/REICHERT METALLURGICAL MICROSCOPE:Metallurgical Microscope - Camera and controller not included
|
1
|
|
|
F* |
Scotia, New York |
|
|
1641
|
Leica
|
Leica |
POLYLITE 88 |
in Optical Microscopes
LEICA/REICHERT MICROSCOPE, MANUAL WAFER INSPECTION :Manual Wafer Inspection Microscope MicroVision MVT 1080 Wafer Loader
|
1
|
|
|
F* |
Scotia, New York |
|
|
106575
|
Leica
|
Leica |
Polylite 88 |
in Optical Microscopes
LEICA/REICHERT MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Polylite 88 Reflected Light Microscope
|
2
|
|
|
F* |
Scotia, New York |
|
|
186513
|
Leica
|
Leica |
POLYLITE 88 |
in Optical Microscopes
LEICA/REICHERT WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system
|
1
|
|
|
|
Scotia, New York |
|
|
186518
|
Leica
|
Leica |
POLYLITE 88 |
in Optical Microscopes
LEICA/REICHERT WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system
|
1
|
|
|
F* |
Scotia, New York |
|
|
57070
|
Leitz
|
Leitz |
Laborlux 12 HL |
in Optical Microscopes
LEITZ BRIGHTFIELD/DARKFIELD FILAR EYEPIECE:Brightfield, Darkfield and DIC Leitz Filar Eyepiece with Boeckeler Micrometer and Readout
|
1
|
|
5,951.59 |
F* |
Scotia, New York |
|
|
115354
|
Leitz
|
Leitz |
060-680-014 |
in Optical Microscopes
LEITZ MEASURING MICROSCOPE BODY:Measuring Microscope - Body only Unit is being sold AS IS
|
1
|
|
2,500.67 |
|
Scotia, New York |
|
|
47433
|
Leitz
|
Leitz |
Secolux 6X6 |
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD:Brightfield Reflected Light Microscope
|
1
|
|
5,701.53 |
F* |
Scotia, New York |
|
|
113754
|
Leitz
|
Leitz |
Ergolux |
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Brightfield/Darkfield Reflected Light
|
1
|
|
4,901.31 |
F* |
Scotia, New York |
|
|
89143
|
Leitz
|
Leitz |
Ergolux |
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Brightfield Reflected Light/Transmitted Light Microscope
|
1
|
|
5,251.41 |
F* |
Scotia, New York |
|
|
205912
|
Matrix Corp
|
Matrix Corp |
Matrix X3 |
in Metrology Equipment
Matrix X3 X-Ray System:high speed X-Ray system
|
1
|
|
|
|
Regensburg, Bavaria |
|
|
58429
|
McPherson
|
McPherson |
2035 |
in Spectrophotometers
MCPHERSON 2035 SPECTROMETER:UV-VIS-IR Spectrophotometer
|
1
|
|
|
F* |
Scotia, New York |
|
|
18582
|
Melles Griot
|
Melles Griot |
04TFF002 |
in Optical Microscopes
MELLES GRIOT FINE FOCUSING MICROSCOPE:Fine Focusing Microscope
|
3
|
|
450.12 |
|
Scotia, New York |
|
|
111690
|
MICROSCOPE STAND
|
MICROSCOPE STAND |
in Parts and Accessories, Microscope
MICROSCOPE STAND:Large StereoZoom Microscope Stand
Available only with purchase of a B&L, Nikon, or Olympus StereoZoom Microscope
|
1
|
|
600.16 |
F* |
Scotia, New York |
|
|
81042
|
Microspec
|
Microspec |
WDX-2A(Spectrometer) |
in Electron Microscopy
MICROSPEC WDX-2A SPECTROMETER:Spectrometer
|
1
|
|
|
|
Scotia, New York |
|
|
133353
|
Mitutoyo
|
Mitutoyo |
176-901-1A |
in Optical Microscopes
MITUTOYO TOOLMAKER'S MICROSCOPE:Toolmakers Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
|
176525
|
Mitutoyo
|
Mitutoyo |
FS-110T - 378-121 |
in Optical Microscopes
MITUTOYO ULTRAPLAN MATERIALS INSPECTION MICROSCOPE:Materials Inspection Microscope - Reflected & Transmitted Light
|
1
|
|
|
F* |
Scotia, New York |
|
|
238960
|
Rudolph Technologies
|
Rudolph Technologies |
MPC 200XCu |
in Film Thickness Testers
MP200:Rudolph MetaPulse 200 non copper / double delay stage with 5" Chuck. 2 Loadports for 6/8 inch Laser is broken!
|
1
|
|
|
|
Villach, Carinthia |
|
|
244540
|
Rudolph Technologies
|
Rudolph Technologies |
MP200 |
in Film Thickness Testers
MP200 double path tool :non copper tool; double path tool delay stage; 6 inch chuck
|
1
|
|
|
|
Villach, Carinthia |
|
|
3863
|
Nanometrics
|
Nanometrics |
NANOLINE III |
in Critical Dimension Measurement Equipment
NANOMETRICS CRITICAL DIMENSION COMPUTER:Critical Dimension Computer
Large memory digital computer calculates line widths and provides statistics on in process wafer and photomasks.
|
1
|
|
|
F* |
Scotia, New York |
|
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