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ALL CATEGORIES   Wafer Manufacturing

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	View All Offers Under Wafer Manufacturing Metrology Equipment » Switch Major Category		Click an item's ID# below for its full specifications and source, or: Group Offers into sub-categories under Wafer Manufacturing Metrology Equipment List all 7 product types under Wafer Manufacturing Metrology Equipment

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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   247845 KLA-Tencor   KLA-Tencor   Auto RS-55tc  4 & 6 Point Probes in Resistivity Testers KLA-Tencor Auto RS-55tc Resistivity Test Tool: KLA-TENCOR Auto RS-55tc Resistivity Mapping System Accommodates all Wafer Sizes from 50mm – 200mm 5 Megaohm/sq Measurement Range Typical Measurement Time: 5 – 4.5 Seconds per Test Site <0.2% (1 sigma) Measurement Repeatability Thermal Chuck Temperature Measurement Accuracy: ±0.5ºC PC Based System Controller 25 MHz 486 Based MPU 44 MB Removable Hard Disk 110 MB Fixed Hard Disk Drive 5” Floppy Disk Drive X-Y Map: Up to 1200 Sites Programmable Probe Qualification: 20 sites 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included) 1 80,021.44 N* Austin, Texas 247844 KLA-Tencor   KLA-Tencor   RS-55tc  4 & 6 Point Probes in Resistivity Testers KLA-Tencor RS-55tc Resistivity Test Tool: KLA-Tencor RS-55tc Resistivity Test Tool Accommodates all Wafer Sizes from 50mm – 200mm Sheet Resistance Measurement of 5 mohm/sq to 5 Mohm/sq Typical Measurement Time: 5 – 4.5 Seconds per Test Site <0.2% (1 sigma) Measurement Repeatability X-Y Map: Programmable Up to 1200 Sites Probe Qualification: 20 sites 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included) PC Based System Controller with Color Monitor 1 35,009.38 N* Austin, Texas 245141 Hitachi   Hitachi   REM-S 9380-2  Wafer Manufacturing Metrology Equipment - Other in Wafer Manufacturing Metrology Equipment METV34-01 (REM-S 9380-2): Microscope for Critical Dimension 1   Villach, Carinthia 212139 Minato   Minato   MM-6600  WaferTesters - Other in Wafer Testers Minato MM-6600 Wafer Mobility Tester: Minato MM-6600 Wafer Mobility Tester MECS UX-1000 Wafer Handling Robot PC Controlled 2   Plano, Texas 212140 Minato MM-6600 Wafer Mobility Tester  Minato MM-6600 Wafer Mobility Tester  WaferTesters - Other in Wafer Testers Minato MM-6600 Wafer Mobility Tester: Minato MM-6600 Wafer Mobility Tester MECS UX-1000 Wafer Handling Robot PC Controlled 2   Plano, Texas 26911 Philips   Philips   DCD 120  Xray Diffractometers in Wafer Manufacturing Metrology Equipment PHILIPS DOUBLE CRYSTAL DIFFRACTOMETER: Double Crystal Diffractometer Double Crystal Diffractometer optimized for fast rocking curve analysis of pseudomorphic epitaxial layer structures. 1   F* Scotia, New York 245221 Tencor   Tencor   RS75-01  Wafer Manufacturing Metrology Equipment - Other in Wafer Manufacturing Metrology Equipment RS75-01: wafer sheet resistance measurement system, Tool in production 1   Villach, Carinthia 245222 Prometrix   Prometrix   UV1080-01  Wafer Manufacturing Metrology Equipment - Other in Wafer Manufacturing Metrology Equipment UV1080-01: KLA-Tencor - Tool in production - Measures Film Thickness, Refractive Index (RI) and Extinction Coefficient of Single and Multi-Layer Thin Film Stacks Simultaneously without Referencing 1   Villach, Carinthia

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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Items from the following manufacturers are offered under Wafer Manufacturing Metrology Equipment: Hitachi, KLA-Tencor, Minato, Philips, Prometrix, Tencor