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List all 6 product types under Test SystemsList all 6 product types under Test Systems


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
178419
Advantest  

Advantest  

T5571P 

List all items of this typeParametric Wafer Testers

in Test Systems

1   Taichung, Taichung City
Advantest, T5571P Probe, 300mm:
Manufactured in 2007; Status: Bagged and Skidded
185301
Agilent Tech  

Agilent Tech  

V3300 

List all items of this typeMemory Test Systems

in Device Testers

1   F* Singapore,
Agilent V3300, Vera Tester:
Versa Tester for FZTAT (Memory portion)
179384
LTX  

LTX  

PPS 

List all items of this typeAnalog Test Systems

in Device Testers

1   Regensburg, BY
179385
LTX  

LTX  

PPS 

List all items of this typeAnalog Test Systems

in Device Testers

1   F* Regensburg, BY
132030
Mosaid  

Mosaid  

MS4155 

List all items of this typeMemory Test Systems

in Device Testers

1   F* Plano, TX
MOSAID MS4155:
Memory Test System
179115
Mosaid  

Mosaid  

MS4205 

List all items of this typeMemory Test Systems

in Device Testers

1   F* Burlington, VT
Mosaid, MS4205 , Manual Memory Tester, 300mm 200mm:
Model MS4205 General memory testers
200/400MHz, 16x16y addressing, 36 data
Wafer probe manipulators available, and chillers
Multiple units avaialble
178718
Mosaid  

Mosaid  

MS 4205 

List all items of this typeMemory Test Systems

in Device Testers

1   Taichung, Taichung City
Mosaid, MS4205 , Manual Memory Tester, 300mm:
Mosaid, MS4205 , Manual Memory Tester,  300mm


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
195485
Reedholm  

Reedholm  

RI-35 

List all items of this typeParametric Wafer Testers

in Test Systems

1   F* Burlington, Vermont
REEDHOLM RI-35, DC Parametric Tester:
REEDHOLM RI-35, DC Parametric Tester

"believed to have GPIB cards 
Believed not to have EG2001 drivers.  
May have EG4090 and TEL prober drivers
Standard Reedholm tester instrumentation."


S/N : 567
195486
Reedholm  

Reedholm  

RI-35 

List all items of this typeParametric Wafer Testers

in Test Systems

1   Burlington, Vermont
REEDHOLM RI-35, DC Parametric Tester:
REEDHOLM RI-35, DC Parametric Tester

Missing parts

"believed to have GPIB cards 
Believed not to have EG2001 drivers.  
May have EG4090 and TEL prober drivers
Standard Reedholm tester instrumentation."



Cold - Off Line

S/N : 535
195487
Reedholm  

Reedholm  

RI-35 

List all items of this typeParametric Wafer Testers

in Test Systems

1   Burlington, Vermont
REEDHOLM RI-35, DC Parametric Tester:
REEDHOLM RI-35, DC Parametric Tester

"this unit was working before we shut down the system some 2 to 3yrs ago.
believed to have GPIB cards 
Believed not to have EG2001 drivers. 
May have EG4090 and TEL prober drivers
Standard Reedholm tester instrumentation."


Cold

S/N : N/A
179386
LTX  

LTX  

PVI 

List all items of this typeAnalog Test Systems

in Device Testers

1   Regensburg, BY
179387
LTX  

LTX  

PVI 

List all items of this typeAnalog Test Systems

in Device Testers

1   Regensburg, BY
178422
Yokogawa  

Yokogawa  

MT6060 

List all items of this typeParametric Wafer Testers

in Test Systems

1   Taichung, Taichung City
Yokogawa, MT6060 Probe, 300mm:
Status: Bagged and Skidded


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Test Systems:
Advantest, Agilent Technologies, LTX, Mosaid, Reedholm, Yokogawa