| Item ID |
Short Description |
Product Type / Details |
#
|
Price |
Note |
Location |
| Make |
Model |
| |
|
$ |
|
 |
110263 |
ADE |
Episcan 1000 |
in Spectrometers
|
1
|
|
|
  |
Plano, TX |
| |
ADE Episcan 1000 Film Thickness Measurement & Mapping Tool |
 |
98523 |
Bio-Rad |
QS-300 |
in Spectrometers
|
1
|
|
|
F* |
Austin, TX |
| |
Bio-Rad QS-300 150mm Bio-Rad QS-300 FTIR Spectrometer |
 |
102212 |
Bio-Rad |
QS-312 |
in Spectrometers
|
1
|
|
|
  |
Austin, TX |
| |
Bio-Rad QS-312 Bio-Rad QS-312 FT-IR Spectrometer |
 |
117040 |
Bio-Rad |
S-300 |
in Spectrometers
|
1
|
|
|
F* |
Austin, TX |
| |
Bio-Rad S-300 Bio-Rad S-300 Spectrometer FTIR |
 |
104748 |
Bio-Rad |
QS-312 |
in Spectrometers
|
1
|
|
|
  |
Plano, TX |
| |
BioRad QS-312 BioRad QS-312 FTIR Spectrometer |
 |
74140 |
Bio-Rad |
QS-408M |
in Spectrometers
|
1
|
|
|
  |
Plano, TX |
| |
BioRad QS-408M - PARTS TOOL ONLY Manual FT-IR (Fourier Transform Infrared Spectrophotometer) for Epi Measurement - 200mm Wafers |
 |
49833 |
Sloan Dektak |
IIA |
in Film Thickness Testers
|
1
|
|
14,800.00
|
  |
Scotia, NY |
| |
DEKTAK IIA Accurately measures vertical features
ranging in height from 131 microns to 50 Å
on a variety of substrate surfaces. |
 |
3826 |
Dektak |
IIA |
in Film Thickness Testers
|
1
|
|
16,950.00
|
F* |
Scotia, NY |
| |
DEKTAK IIA Accurately measures vertical features
ranging in height from 131 microns to 50 Å
on a variety of substrate surfaces. |
 |
101306 |
ELLIPSOMETER |
in Film Thickness Testers
|
1
|
|
|
F* |
Scotia, NY |
| |
ELLIPSOMETER Ellipsometer
WANTED:
Looking for ellipsometer with automated load, unload
780 mm x 650 mm capability
Please contact us if you have one available. |
 |
45435 |
Gaertner |
L116B |
in Film Thickness Testers
|
1
|
|
|
F* |
Scotia, NY |
| |
GAERTNER L116B Upgraded in 2000 |
 |
39958 |
Gaertner |
L2W16E.1550 |
in Film Thickness Testers
|
1
|
|
39,000.00
|
F* |
Scotia, NY |
| |
GAERTNER L2W16E.1550 Ellipsometer |
 |
102640 |
Thermo Electron |
ELEMENT GD |
in Spectrometers
|
1
|
|
|
F* |
Scotia, NY |
| |
GLOW DISCHARGE MASS SPECTROMETER WANTED:
Looking for Glow Discharge Mass Spectrometer
Thermo Electron ELEMENT GD or similar
Please contact us if you have one available. |
 |
100558 |
Tencor |
ALPHA STEP 500 |
in Film Thickness Testers
|
1
|
|
|
  |
Scotia, NY |
| |
KLA TENCOR ALPHA STEP 500 Profiler |
 |
125630 |
KLA-Tencor |
AlphaStep 200 |
in Film Thickness Testers
|
1
|
|
|
N* |
Plano, TX |
| |
KLA-Tencor Alpha-Step 200 Profilometer |
 |
104306 |
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
|
1
|
|
|
  |
Plano, TX |
| |
KLA-Tencor AlphaStep 300 Profilometer Profilometer |
 |
89756 |
KLA-Tencor |
P-1 |
in Film Thickness Testers
|
1
|
|
|
  |
Austin, TX |
| |
KLA-Tencor P-1 200mm KLA-Tencor P-1 High Sensitivity Surface Profiler |
 |
88268 |
KLA-Tencor |
SpectraFx 200 |
in Film Thickness Testers
|
1
|
|
|
  |
Plano, TX |
| |
KLA-Tencor SpectraFx 200 Optical Thin-Film Metrology System |
 |
124560 |
KLA-Tencor |
P-11 |
in Film Thickness Testers
|
1
|
|
30,000.00
|
  |
Austin, TX |
| |
KLA/Tencor P-11 Profilometer Guaranteed functional at time of source inspection. |
 |
58429 |
McPherson |
2035 |
in Spectrophotometers
|
1
|
|
|
F* |
Scotia, NY |
| |
MC PHERSON 2035 UV-VIS-IR Spectrophotometer |
 |
124549 |
Metricon |
PC-2000 |
in Film Thickness Testers
|
1
|
|
5,000.00
|
  |
Austin, TX |
| |
Metricon PC-2000 Thin Film Thickness and Refractive Index Measurement System. Unparalled accuracy in measurement of thin film thickness, refractive index and bulk refractive index.
Prism Coupler Instrument |
 |
89821 |
Nanometrics |
8300X |
in Film Thickness Testers
|
1
|
|
|
  |
Austin, TX |
| |
Nanometrics 8300X Auto-Load 200mm/300mm Nanometrics 8300X Film Thickness Analyzer with Spectroscopic Ellipsometry |
 |
102168 |
Nanometrics |
ECV Pro |
in Film Thickness Testers
|
1
|
|
|
F* |
Scotia, NY |
| |
NANOMETRICS ECV PRO PROFILER WANTED:
Advanced Electrochemical Capacitance Voltage Profiler
Looking for a Nanometrics ECV Pro Profiler
Please contact us if you have one available. |
 |
102865 |
Nanometrics |
NanoSpec / AFT 2100 |
in Film Thickness Testers
|
1
|
|
|
F* |
Austin, TX |
| |
Nanometrics NanoSpec / AFT 2100UV Nanometrics NanoSpec / AFT 2100UV Thin Film Measurement System.
System is capable of UV measurements. Has two lamps. One is standard halogen lamp. Other is a Deuterium UV lamp. The UV is used for thin films under 500A and special UV programs. |
 |
100559 |
Nanometrics |
NANOSPEC 210 |
in Film Thickness Testers
|
1
|
|
18,500.00
|
  |
Scotia, NY |
| |
NANOMETRICS NANOSPEC 210 Thin Film Measurement System |
 |
10354 |
Nanometrics |
NanoSpec AFT |
in Spectrophotometers
|
1
|
|
|
 |
Plano, TX |
| |
Nanometrics NanoSpec AFT PARTS TOOL ONLY |
 |
61871 |
Nanometrics |
NanoSpec 181 |
in Spectrophotometers
|
1
|
|
|
F* |
Plano, TX |
| |
Nanometrics NanoSpec AFT #010-0181 Film Thickness Analyzers |
 |
61872 |
Nanometrics |
NanoSpec 181 |
in Spectrophotometers
|
1
|
|
|
F* |
Plano, TX |
| |
Nanometrics NanoSpec AFT #010-0181 Film Thickness Analyzers |
 |
116240 |
Nanometrics |
NanoSpec AFT 2100 |
in Spectrophotometers
|
1
|
|
|
  |
Plano, TX |
| |
Nanometrics NanoSpec AFT 2100 Automatic Film Thickness System |
 |
116241 |
Nanometrics |
NanoSpec AFT 212 |
in Spectrophotometers
|
1
|
|
|
  |
Plano, TX |
| |
Nanometrics NanoSpec AFT 212 Automatic Film Thickness System |
 |
99360 |
Nicolet |
ECO-8S |
in Spectrometers
|
3
|
|
|
  |
Austin, TX |
| |
Nicolet ECO-8S Nicolet ECO-8S FTIR Wafer Analysis System |
 |
42358 |
NICOLET NEXUS 470 |
in Spectrometers
|
1
|
|
|
F* |
Scotia, NY |
| |
NICOLET NEXUS 470 FT IR with Spectra-Tech Continuum Scope and
TGA Interface |
 |
66537 |
Nicolet |
205 |
in Spectrometers
|
1
|
|
|
F* |
Austin, TX |
| |
NICOLET SPECTROMETER FT-IR, MODEL 205 Nicolet Spectrometer FT-IR, Model 205, Includes all five disks. |
 |
76100 |
Philips |
PW-2800 |
in Spectrometers
|
1
|
|
|
  |
Austin, TX |
| |
Philips PW-2800 Philips PW-2800 X-Ray Fluorescent Inspection System |
 |
77964 |
Philips SPW-2800 |
in Spectrometers
|
1
|
|
|
  |
Plano, TX |
| |
Philips SPW-2800 High-Precision Wafer Analyzer |
 |
85708 |
Plas Mos |
SD 2000 |
in Film Thickness Testers
|
1
|
|
|
  |
Austin, TX |
| |
PLAS MOS SD 2000 PLAS MOS SD 2000 AUTOMATIC ELLIPSOMETER |
 |
104453 |
Plasmos GmbH |
SD2000 |
in Film Thickness Testers
|
1
|
|
|
 |
Scotia, NY |
| |
PLASMOS GMBH SD2000 Ellipsometer
WANTED:
Looking for an ellipsometer with spot size of 10um.
Please contact us if you have one available. |
 |
99380 |
Prometrix |
FT-530 |
in Spectrometers
|
2
|
|
|
  |
Austin, TX |
| |
Prometrix FT-530 Prometrix FT-530 Thin Film Measurement System |
 |
99382 |
Prometrix |
FT-650 |
in Spectrometers
|
1
|
|
|
  |
Austin, TX |
| |
Prometrix FT-650 Prometrix FT-650 Film Thickness Mapping System |
 |
99384 |
Prometrix |
SM-300 |
in Spectrometers
|
1
|
|
|
  |
Austin, TX |
| |
Prometrix SM-300 Prometrix SM-300 Film Thickness Mapping System |
 |
122734 |
Rigaku |
3630 |
in Spectrometers
|
1
|
|
|
 |
Plano, TX |
| |
Rigaku 3630 Xray Fluorescence Spectrometer |
 |
46596 |
RIGAKU 3630 |
in Spectrometers
|
1
|
|
|
F* |
Plano, TX |
| |
RIGAKU 3630 TXRF WAFER/DISK ANALYZER |
 |
53290 |
Rigaku 3630 Xray Fluorescence Spectrometer |
in Spectrometers
|
1
|
|
|
  |
Plano, TX |
| |
Rigaku 3630 Xray Fluorescence Spectrometer TXRF Wafer Analyzer |
 |
54993 |
Rigaku 3700H |
in Spectrometers
|
1
|
|
|
  |
Plano, TX |
| |
Rigaku 3700H TXRF Wafer Analyzer |
 |
54927 |
Rigaku |
3700H TXRF |
in Spectrometers
|
1
|
|
|
  |
Austin, TX |
| |
Rigaku 3700H TXRF 200mm Rigaku 3700H TXRF X-Ray Spectrometer |
 |
53291 |
Rigaku 3750 |
in Spectrometers
|
1
|
|
|
  |
Plano, TX |
| |
Rigaku 3750 TXRF Wafer Analyzer |
 |
103332 |
Rigaku |
TXRF 300S |
in Spectrometers
|
1
|
|
|
F* |
Scotia, NY |
| |
RIGAKU TXRF 300S X-Ray Fluoresence Spectrometer |
 |
89825 |
Rigaku |
Wafer X-300 |
in Spectrometers
|
1
|
|
|
  |
Austin, TX |
| |
Rigaku Wafer X-300 Rigaku Wafer X-300 X-Ray Fluorescence System |
 |
89903 |
Rudolph Technologies |
Metapulse 300 |
in Film Thickness Testers
|
1
|
|
|
  |
Austin, TX |
| |
Rudolph Metapulse 300 200mm/300mm Rudolph Metapulse 300 Film Thickness Measurement System |
 |
58212 |
Rudolph Research |
AUTO EL RE-350 |
in Film Thickness Testers
|
1
|
|
|
  |
Scotia, NY |
| |
RUDOLPH RESEARCH AUTO EL RE-350 Ellipsometer |
 |
86164 |
Rudolph Technologies |
AUTO EL |
in Film Thickness Testers
|
1
|
|
|
  |
Scotia, NY |
| |
RUDOLPH RESEARCH ELLIPSOMETER Rudolph Research Model AUTO EL |
 |
97370 |
Rudolph Technologies |
AUTO EL IV-MS |
in Film Thickness Testers
|
1
|
|
15,000.00
|
F* |
Scotia, NY |
| |
RUDOLPH TECHNOLOGIES AUTO EL IV-MS Ellipsometer |
 |
50006 |
Sagax Isoscope 125 |
in Film Thickness Testers
|
1
|
|
|
  |
Plano, TX |
| |
Sagax Isoscope 125 Ellipsometer |
 |
89961 |
SNP |
9000 |
in Film Thickness Testers
|
1
|
|
|
F* |
Austin, TX |
| |
Stylus Nano Profilometer 9000 200mm/300mm Stylus Nano Profilometer |
 |
108231 |
Veeco Instruments,In |
DEKTAK 3 ST |
in Film Thickness Testers
|
1
|
|
28,500.00
|
  |
Scotia, NY |
| |
VEECO DEKTAK 3 ST AUTO I Surface Profile Measuring System |
 |
110274 |
Veeco Instruments,In |
Dektak 3-30 |
in Film Thickness Testers
|
1
|
|
|
 |
Plano, TX |
| |
Veeco Dektak 3-30 Profilometer Surface Profile Measuring System |
 |
98184 |
Veeco Instruments,In |
Dektak 3030 Auto II |
in Film Thickness Testers
|
1
|
|
22,500.00
|
F* |
Scotia, NY |
| |
VEECO DEKTAK 3030 AUTO II Profilometer |
 |
96384 |
Veeco Instruments,In |
Dektak 3030 |
in Film Thickness Testers
|
1
|
|
|
  |
Plano, TX |
| |
Veeco Dektak 3030 Profilometer Surface Profile Measuring System |
 |
50026 |
Veeco Instr Inc |
Dektak I |
in Film Thickness Testers
|
1
|
|
|
F* |
Plano, TX |
| |
Veeco Dektak I Profilometer PARTS TOOL ONLY |
 |
50011 |
Veeco Instr Inc |
Dektak IIA |
in Film Thickness Testers
|
1
|
|
|
F* |
Plano, TX |
| |
Veeco Dektak IIA Profilometer |
 |
109557 |
Dektak |
3030 |
in Film Thickness Testers
|
1
|
|
21,500.00
|
F* |
Scotia, NY |
| |
VEECO STYLUS PROFILER Veeco Model Dektak 3030 |
 |
119455 |
Veeco Instruments,In |
Dektak 3030 |
in Film Thickness Testers
|
1
|
|
21,500.00
|
  |
Scotia, NY |
| |
VEECO STYLUS PROFILER Veeco Instruments Model Dektak 3030 |