| Item ID |
Short Description |
Product Type / Details |
#
|
Price |
Note |
Location |
| Make |
Model |
| |
|
$ |
|
 |
115697 |
Bio-Rad |
Q5 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Austin, TX |
| |
Bio-Rad Q5 CD Measurement, Single and Two-Axis Overlay Registration |
 |
54905 |
Bio-Rad |
Q7/Q8 |
in Critical Dimension Measurement Equipment
|
2
|
|
|
  |
Austin, TX |
| |
Bio-Rad Q7/Q8 Bio-Rad Q7/Q8 Overlay Metrology Tool for up to 200mm Wafers |
 |
31390 |
Bio-Rad |
Q5 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Plano, TX |
| |
BioRad Q5 CD Measurement, Single and Two-Axis Overlay Registration |
 |
121504 |
Bio-Rad |
Q5 |
in Critical Dimension Measurement Equipment
|
2
|
|
|
 |
Plano, TX |
| |
Biorad Q5 Overlay Registration Tool |
 |
121505 |
Bio-Rad |
Q7 |
in Critical Dimension Measurement Equipment
|
3
|
|
|
 |
Plano, TX |
| |
Biorad Q7 Overlay Registration Tool |
 |
54651 |
Bio-Rad |
Q7/Q8 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Plano, TX |
| |
BioRad Q7/Q8 Overlay Metrology Tool Overlay Metrology Tool for up to 200mm Wafers |
 |
54652 |
Bio-Rad |
Q7/Q8 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
F* |
Plano, TX |
| |
BioRad Q7/Q8 Overlay Metrology Tool Overlay Metrology Tool for up to 200mm Wafers |
 |
122412 |
Bio-Rad |
Q8 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
 |
Plano, TX |
| |
Biorad Q8 Overlay Registration |
 |
107547 |
Hitachi |
S-8840 |
in Critical Dimension Measurement Equipment
|
1
|
|
375,000.00
|
F* |
Regensburg, BY |
| |
CD-SEM Hitachi S-8840 LOCATION: Villach SERIAL NUMBER(S): 9101-01 |
 |
107548 |
Hitachi |
S8C40 |
in Critical Dimension Measurement Equipment
|
1
|
|
375,000.00
|
F* |
Regensburg, BY |
| |
CD-SEM Hitachi S-8C40 LOCATION: Villach SERIAL NUMBER(S): 5502-01 |
 |
113771 |
Hitachi |
S-4500 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Austin, TX |
| |
HITACHI S-4500 SCANNING ELECTRON MICROSCOPE Electron Scanning Microscope
|
 |
89744 |
Hitachi |
S-4700 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
F* |
Austin, TX |
| |
Hitachi S-4700 Hitachi S-4700 Field Emission/Scanning Electron Microscope |
 |
94170 |
Hitachi |
S-628OH |
in Critical Dimension Measurement Equipment
|
1
|
|
40,000.00
|
F* |
Dallas, TX |
| |
Hitachi S-628OH Inline SEM |
 |
35762 |
Hitachi |
S-7000 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Plano, TX |
| |
Hitachi S-7000 CD SEM Measurement Tool |
 |
118934 |
Hitachi |
S-7000 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Austin, TX |
| |
Hitachi S-7000 CD SEM Measurement Tool |
 |
44179 |
Hitachi |
S-7800/S-8820 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Austin, TX |
| |
Hitachi S-7800 or S-8820 Hitachi S-7800 or S-8820 External Power Supply Cabinet with 4 New Contactors |
 |
85796 |
Hitachi |
S-6000 |
in Critical Dimension Measurement Equipment
|
1
|
|
10,000.00
|
F* |
Dallas, TX |
 |
91861 |
JEOL |
JWS 3000 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
F* |
Scotia, NY |
| |
JEOL JWS 3000 Representative photo |
 |
77955 |
JEOL |
JWS-7505ZH |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Plano, TX |
| |
Jeol JWS-7505ZH Critical Dimension Scanning Electron Microscope |
 |
76095 |
JEOL |
JWS-7505ZH |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Austin, TX |
| |
JEOL JWS-7505ZH JEOL JWS-7505ZH CD-SEM |
 |
99978 |
KLA-Tencor |
5100 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Plano, TX |
| |
KLA-Tencor 5100 Overlay Metrology Tool for 200mm Wafers |
 |
71132 |
Nanometrics |
Nanoline 50-2 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Austin, TX |
| |
NANOMETRICS NANOLINE 50-2 Nanometrics Nanoline 50-2 CD Measurement System. Includes TMC Technical Vibration Table. |
 |
49938 |
Nanometrics |
CD-50 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Plano, TX |
| |
Nanometrics Nanoline CD-50 CD Measurement System |
 |
5074 |
Nanometrics |
CD-50 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Plano, TX |
| |
Nanometrics Nanoline CD-50 Critical Dimension Measurement Tool for up to 6" Wafers |
 |
3863 |
Nanometrics |
NANOLINE III |
in Critical Dimension Measurement Equipment
|
1
|
|
|
F* |
Scotia, NY |
| |
NANOMETRICS NANOLINE III Large memory digital computer calculates line widths and provides statistics on in process wafer and photomasks.
|
 |
104942 |
Oxford Instruments |
7200 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
Austin, TX |
| |
Oxford Instruments EDX Model 7200 & Controller Oxford Instruments EDX Model 7200 wit controller and software, serial # is 04838-2390-289-51 / Det. Area:10mm2 / Att.1:327629805 / Window:ATW2 / Att.2:0120024 / Resol:138eV / Bias:-500V |
 |
71139 |
Tamar Technologies |
CD Measure |
in Critical Dimension Measurement Equipment
|
1
|
|
|
F* |
Austin, TX |
| |
TAMAR TECHNOLOGY Tamar Technology Semi-Automated Critical Dimension Measurement System. |