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Critical Dimension Measurement Equipment


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List all 4 product types under Critical Dimension Measurement EquipmentList all 4 product types under Critical Dimension Measurement Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

189511
Applied Materials  

Applied Materials  

Semvision CX 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Burlington, Vermont
Applied Materials, SEMVision CX, 200mm, :
Applied Materials, SEMVision CX, 200mm,

Serial Number is W854.
121504
Bio-Rad  

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

2   Plano, TX
Biorad Q5:
Overlay Registration Tool
31390
Bio-Rad  

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   Plano, TX
BioRad Q5:
Overlay Registration Tool - Has Been Upgraded to a Q6

CD Measurement, Single and Two-Axis Overlay Registration
121505
Bio-Rad  

Bio-Rad  

Q7 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

3   Plano, TX
Biorad Q7:
Overlay Registration Tool
54651
Bio-Rad  

Bio-Rad  

Q7/Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   F* Plano, TX
BioRad Q7/Q8 Overlay Metrology Tool:
Overlay Metrology Tool for up to 200mm Wafers
54652
Bio-Rad  

Bio-Rad  

Q7/Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   F* Plano, TX
BioRad Q7/Q8 Overlay Metrology Tool:
Overlay Metrology Tool for up to 200mm Wafers
122412
Bio-Rad  

Bio-Rad  

Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   Plano, TX
Biorad Q8:
Overlay Registration
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Plano, TX
Hitachi S-7000:
CD SEM Measurement Tool
178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Singapore,
Hitachi, S-7800 CD-SEM, 200mm:
Manufactured in 2008
195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Singapore,
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
77955
JEOL  

JEOL  

JWS-7505ZH 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F* Plano, TX
Jeol JWS-7505ZH:
Critical Dimension Scanning Electron Microscope
3863
Nanometrics  

Nanometrics  

NANOLINE III 

List all items of this typeOptical CD Measurement

in Critical Dimension Measurement Equipment

1   F* Scotia, NY
NANOMETRICS CRITICAL DIMENSION COMPUTER:
Critical Dimension Computer

Large memory digital computer calculates line widths
and provides statistics on in process wafer and photomasks.


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Critical Dimension Measurement Equipment:
Applied Materials, Inc., Bio-Rad, Hitachi, JEOL, Nanometrics