| Item ID |
Short Description |
Product Type / Details |
#
|
Price |
Note |
Location |
| Make |
Model |
| |
|
$ |
|
 |
87165 |
Bede Scientific |
Bede Metrix-L |
in Wafer Manufacturing Metrology Equipment
|
1
|
|
750,000.00
|
F* |
Dallas, TX |
| |
Bede Scientific Xray Diffractometer
|
 |
89180 |
CDE |
463 |
in Resistivity Testers
|
2
|
|
|
F* |
Austin, TX |
| |
CDE ResMap 463 300mm FOUP CDE ResMap 463 Resistivity Mapper/4-Point Prober(s), can also run 150mm & 200mm in open cassette.
|
 |
99573 |
CDE |
RESMAP 463-OC |
in Resistivity Testers
|
1
|
|
|
F* |
Scotia, NY |
| |
CREATIVE DESIGN ENGINEERING RESMAP 463-OC Four Point Probe |
 |
53289 |
KLA-Tencor |
RS-55 |
in Resistivity Testers
|
1
|
|
|
F* |
Plano, TX |
| |
KLA-Tencor RS-55 Resistivity Mapping System Resistivity Tester |
 |
26911 |
Philips |
DCD 120 |
in Wafer Manufacturing Metrology Equipment
|
1
|
|
|
F* |
Scotia, NY |
| |
PHILIPS DCD 120 Double crystal diffractometer optimized for fast rocking curve analysis of pseudomorphic epitaxial layer structures.
|
 |
46035 |
Philips |
XPERT HR2 |
in Wafer Manufacturing Metrology Equipment
|
1
|
|
|
F* |
Scotia, NY |
| |
PHILIPS XPERT HR2 Software, Firmware updated in 2004
Generator upgraded in 2000
|
 |
5075 |
Prometrix |
VP10 |
in Resistivity Testers
|
1
|
|
|
F* |
Plano, TX |
| |
Prometrix VP10 Four Point Probe Automated Four Point Probe for Resistivity Measurement, Parts Tool Only |
 |
122444 |
Prometrix |
VP10 |
in Resistivity Testers
|
1
|
|
|
  |
Plano, TX |
| |
Prometrix VP10 Resistivity Tester VersaProbe VP10 Resistivity Tester |