 |
| |  | Item ID | Item Description | Description | # | Price | Note | Location |
|---|
| Make | Model |
|---|
| | | | | | $ | | |  | 88812 | Bio-Rad | QS408M/FTI | Spectrometer | 1 |  | 20,000.00 |  | Dallas, TX |
 | 89742 | Frontier Semi | Laminar Series II | Adhesion Tester | 1 |  | | F* | Austin, TX |
 | 115777 | KLA | 5011 | Overlay Precision Measurement System | 1 |  | |  | Austin, TX |
 | 101304 | KLA-Tencor | Wafer Mask Inspection Tool | Wafer Mask Inspection Tool | 1 |  | | F* | Scotia, NY |
 | 19725 | Metricon | 2010 | Prism Coupler | 1 |  | 15,500.00 | F* | Scotia, NY |
 | 89822 | Nanometrics | 9000i | Integrated Film Analysis System(s) | 3 |  | |  | Austin, TX |
 | 108940 | Perkin Elmer | Lambda 20 | Resistivity Measure | 1 |  | 160.00 |  | Dallas, TX |
 | 103335 | RVSI | LS 7700 | Lead scanner | 1 |  | 80,000.00 |  | Regensburg, BY |
 | 54633 | SDI FAaST 300 | Wafer Characterization Tool | 1 |  | |  | Plano, TX |
 | 54632 | SDI FAaST 330 | Wafer Characterization Tool | 1 |  | |  | Plano, TX |
 | 101202 | Semiconductor Diagno | FAaST 230 | Surface Voltage Test System | 1 |  | |  | Austin, TX |
 | 100995 | Semiconductor Diagno | SPV | Surface Profiler | 1 |  | |  | Plano, TX |
 | 51003 | Veeco Instr Inc | Dektak SXM | Atomic Force Microscope | 1 |  | | F* | Scotia, NY |
 | 106265 | Veeco Instruments,In | D5000-1 | Atomic Force Microscope | 1 |  | | F* | Scotia, NY |
 | 114726 | Zygo | Zaris | Reticle Transfer System | 1 |  | 60,000.00 |  | Dallas, TX |
NOTE:
when photo available
when document attached
F* if the item is specially featured
N* if the item is newly added, and/or
R* if the item's price is recently reduced.
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