Where owners deal directly without commissions in surplus or used semiconductor manufacturing equipment   more...

Serving  Our Guest Log in    Register to bid, list, and trade

How to post your own listings

View prices in  $ or ...

ALL CATEGORIES   Metrology Eq

View   Search-by-Specs    Input    Edit

	View All Offers Under Film Thickness Testers » Switch Major Category		Click an item's ID# below for its full specifications and source, or: Group Offers into sub-categories under Film Thickness Testers List all 12 product types under Film Thickness Testers

To sort on a column, click the column head; click it again to reverse the sort. Click the links under the Product Type column head to see other like items of that type.

Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   110263 ADE   ADE   Episcan 1000  FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00 1   F* Plano, Texas 225795 Bio-Rad   Bio-Rad   QS-1200  FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-175 Optical Bench Dynamically Tuned Beam Splitter NKBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional 1 110,029.48 Plano, Texas 144802 CR Technology   CR Technology   UF160/0  Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer 1   Plano, TX 45435 Gaertner   Gaertner   L116B  Ellipsometers in Film Thickness Testers GAERTNER ELLIPSOMETER: Ellipsometer Upgraded in 2004 by Gaertner 1   F* Scotia, New York 39958 Gaertner   Gaertner   L2W16E.1550  Ellipsometers in Film Thickness Testers GAERTNER ELLIPSOMETER 150 MM: Ellipsometer 1   Scotia, New York 104306 KLA-Tencor   KLA-Tencor   AlphaStep 300  Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer 1   Plano, TX 247843 KLA-Tencor   KLA-Tencor   UV-1050  Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor UV-1050 Thin Film Measurement Tool: KLA-Tencor UV-1050 Thin Film Measurement Tool Cassette to Cassette Wafer Handling Wafer sizes: 100mm, 150mm & 200mm Broadband UV Optics Dual Beam Spectrophotometry Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP System Control PC with Windows NT OS Summit Application Software GEM / SECS Communication System Installation at Destination Included 1 55,014.74 N* Austin, Texas 58429 McPherson   McPherson   2035  UV-Visible Spectrophotometers in Spectrophotometers MCPHERSON 2035 SPECTROMETER: UV-VIS-IR Spectrophotometer 1   F* Scotia, New York 238960 Rudolph Technologies   Rudolph Technologies   MPC 200XCu  Film Thickness Testers - Other in Film Thickness Testers MP200: Rudolph MetaPulse 200 non copper / double delay stage with 5" Chuck.  2 Loadports for 6/8 inch Laser is broken! 1   Villach, Carinthia 244540 Rudolph Technologies   Rudolph Technologies   MP200  Film Thickness Testers - Other in Film Thickness Testers MP200 double path tool : non copper tool; double path tool delay stage; 6 inch chuck 1   Villach, Carinthia 42358 Nicolet   Nicolet   NEXUS 470  FT-IR Spectrometers in Spectrometers NICOLET (THERMO) FT-IR SPECTROMETER : FT-IR with Spectra-Tech Continuum Scope and TGA Interface Nicolet NEXUS 470 Nicolet acquired by Thermo Scientific   1   F* Scotia, New York 159451 Nicolet   Nicolet   Magna-IR 550  FT-IR Spectrometers in Spectrometers NICOLET Magna-IR 550: FT-IR Spectrometer 1   F* Plano, TX 172746 Plasmos   Plasmos   SD 2004  Ellipsometers in Film Thickness Testers Plasmos SD-2004 Multi-Wavelength Ellipsometer: Plasmos SD-2004 Multi-Wavelength Ellipsometer 1   Plano, TX 179535 Plasmos   Plasmos   SD2000  Ellipsometers in Film Thickness Testers 1   Plano, TX 103332 Rigaku   Rigaku   TXRF 300S  Xray Fluorescence Spectrometers in Spectrometers RIGAKU X-RAY FLUORESENCE SPECTROMETER: X-Ray Fluoresence Spectrometer Model: TXRF 300S 1   F* Scotia, New York 58212 Rudolph Research   Rudolph Research   AUTO EL RE-350  Ellipsometers in Film Thickness Testers RUDOLPH RESEARCH ELLIPSOMETER 150MM: Ellipsometer 1   Scotia, New York 86164 Rudolph Technologies   Rudolph Technologies   AUTO EL  Ellipsometers in Film Thickness Testers RUDOLPH RESEARCH ELLIPSOMETER 150MM: Ellipsometer 1   F* Scotia, New York 50006 Sagax   Sagax   Isoscope 125  Ellipsometers in Film Thickness Testers Sagax Isoscope 125: Ellipsometer 1   Plano, TX 241435 Sloan   Sloan   Dektak 3ST Auto 1  Profilometers in Film Thickness Testers Sloan Dektak3ST Surface Profile Measuring System: Sloan Dektak3ST Auto 1 Surface Profile Measuring System For Step Height & Surface Texture Measurement Self-Contained, Small Footprint Design Joystick Controlled Scanning Stage  8000 Data Points Specimen Stage: 6.5”(dia.); 6”X Axis X 3”Y Axis Travel; 360° θ Maximum Sample Thickness: 1.5” Measurement Display Range: 100Å to 1,310KÅ Vertical Resolution: 1Å/65KÅ; 10Å/655KÅ; 20Å/1310KÅ Stylus Force Range: 1mg to 40mg Scan Length Range: 50m to 50mm Scan Time Range: 3 to 50 Seconds Video Zoom Range: 60X to 420X (Motorized) 1   Plano, Texas 136700 Spectronic Unicam   Spectronic Unicam   4001/4  Spectrometers - Other in Spectrometers SPECTRONIC UNICAM SPECTROPHOTOMETER Genesys 20 4001/4: Spectrophotometer Genesys 20 Visible Spectrometer Spectronic Unicam 4001/4 1   Scotia, New York 140974 Thermo Electron   Thermo Electron   MicroXR GXR/C  Xray Fluorescence Spectrometers in Spectrometers THERMO ELECTRON MICROBEAM X-RAY FLUORESCENCE XRF SYSTEM: X-Ray Fluorescence System Thermo Scientific MicroXR GXR/C 2   Scotia, New York 244539 KLA Tencor   KLA Tencor   UV1250SE  UV-Visible Spectrophotometers in Spectrophotometers 1   Villach, Carinthia 98184 Veeco   Veeco   Dektak 3030 Auto II  Profilometers in Film Thickness Testers VEECO PROFILOMETER: Profilometer 1   F* Scotia, New York 109557 Veeco   Veeco   Dektak 3030  Profilometers in Film Thickness Testers VEECO PROFILOMETER: Profilometer 1   F* Scotia, New York

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Film Thickness Testers: ADE, Bio-Rad, CR Technology, Gaertner, KLA Tencor, KLA-Tencor, McPherson, Nicolet, Plasmos, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Sloan, Spectronic Unicam, Thermo Electron, Veeco Instruments