|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
49926
|
GCA/Tropel
|
GCA/Tropel |
9000 |
in Surface Inspection
GCA/TROPEL 9000:Surface Flatness Analyzer
|
1
|
|
|
|
Plano, TX |
|
|
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
|
5310
|
KLA-Tencor
|
KLA-Tencor |
7700 |
in Surface Inspection
KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER:Patterned Wafer Contamination Analyzer
- Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
- Capable of measuring defects on unpatterned wafers
- Capable of measuring wafers from 4” to 8”
- High sensitivity on after-etch and high topography applications
- Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
|
1
|
|
|
F* |
Scotia, New York |
|
|
50017
|
KLA-Tencor
|
KLA-Tencor |
Surfscan 4500 |
in Surface Inspection
Tencor Surfscan 4500:TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool - Cassette to Cassette Handling of 3” – 6” Wafers
- New HeNe 2mW Laser, 632.8 nm Wavelength
- New HeNe Laser Power Supply
- 2 µ Particle Size Sensitivity
- Automatic Calibration
- Flatscreen Monitor
- System Calibrated & Demonstrated
- Calibration Standard Wafer Included
|
1
|
|
45,012.06 |
|
Plano, Texas |
|
|
|